loadpatents
name:-0.023777008056641
name:-0.012869119644165
name:-0.00055599212646484
GENESIS TECHNOLOGY INC. Patent Filings

GENESIS TECHNOLOGY INC.

Patent Applications and Registrations

Patent applications and USPTO patent grants for GENESIS TECHNOLOGY INC..The latest application filed is for "contact probe and probe device".

Company Profile
0.8.6
  • GENESIS TECHNOLOGY INC. - CA CA
  • Genesis Technology Incorporated - Nishiwaki JP
  • Genesis Technology Incorporation - Nishiwaki JP
  • Genesis Technology Incorporated - Chiyoda-ku, Tokyo JP
  • Genesis Technology Incorporated - Chiyoda-ku JP
  • Genesis Technology Incorporated - 8-2, Marunouchi 1-chome Chiyoda-ku JP
  • Genesis Technology Inc. - Hyogo JP
  • Genesis Technology Incorporated - Nishiwaki-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Lower effort quick-connect coupler
Grant 9,534,699 - Brown January 3, 2
2017-01-03
Contact probe and probe device
Grant 7,015,710 - Yoshida , et al. March 21, 2
2006-03-21
Contact probe and probe device
Grant 6,937,042 - Yoshida , et al. August 30, 2
2005-08-30
Contact probe and probe device
Grant 6,919,732 - Yoshida , et al. July 19, 2
2005-07-19
Contact probe and probe device
Grant 6,917,211 - Yoshida , et al. July 12, 2
2005-07-12
Contact probe and probe device
Grant 6,903,563 - Yoshida , et al. June 7, 2
2005-06-07
Contact probe and probe device
Grant 6,900,647 - Yoshida , et al. May 31, 2
2005-05-31
Contact probe and probe device
App 20050007130 - Yoshida, Hideaki ;   et al.
2005-01-13
Contact probe and probe device
App 20050001643 - Yoshida, Hideaki ;   et al.
2005-01-06
Contact probe and probe device
App 20050001641 - Yoshida, Hideaki ;   et al.
2005-01-06
Contact probe and probe device
App 20050001644 - Yoshida, Hideaki ;   et al.
2005-01-06
Contact probe and probe device
App 20050001642 - Yoshida, Hideaki ;   et al.
2005-01-06
Connection/inspection device for semiconductor elements
Grant 6,815,962 - Hirano , et al. November 9, 2
2004-11-09
Contact probe and probe device
App 20040160236 - Yoshida, Hideaki ;   et al.
2004-08-19
Company Registrations

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