Gemma; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Gemma; Takashi.The latest application filed is for "method and device for measuring wavefront, and exposure method and device".

Company Profile

1.9.8

Gemma; Takashi - Tokyo JP
Gemma, Takashi - Shibuya-ku JP
Gemma; Takashi - Tokyo-to JP
Gemma; Takashi - Shibuya JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and device for measuring wavefront using diffraction grating, and exposure method and device Grant 10,571,340 - Otaki , et al. Feb	2020-02-25
Method And Device For Measuring Wavefront, And Exposure Method And Device App 20190219451 - OTAKI; Katsura ; et al.	2019-07-18
Method and device for measuring wavefront using light-exit section causing light amount distribution in at least one direction Grant 10,288,489 - Otaki , et al.	2019-05-14
Method And Device For Measuring Wavefront, And Exposure Method And Device App 20150160073 - Otaki; Katsura ; et al.	2015-06-11
Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method Grant 7,868,997 - Ishii , et al. January 11, 2	2011-01-11
Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method Grant 7,843,550 - Ishii , et al. November 30, 2	2010-11-30
Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method App 20070076181 - Ishii; Mikihiko ; et al.	2007-04-05
Projection optical system inspecting method and inspection apparatus, and a projection optical system manufacturing method App 20060176457 - Ishii; Mikihiko ; et al.	2006-08-10
Methods and devices for measuring a surface profile of an optical element App 20040036890 - Nakayama, Shigeru ; et al.	2004-02-26
Interferometer system and method of manufactruing projection optical system using same App 20020191195 - Ichihara, Hiroshi ; et al.	2002-12-19
Apparatus and methods for measuring surface profiles and wavefront aberrations, and lens systems comprising same App 20020012124 - Nakayama, Shigeru ; et al.	2002-01-31
Interferometer system and method of manufacturing projection optical system using same App 20010028462 - Ichihara, Hiroshi ; et al.	2001-10-11
Apparatus and methods for detecting and correcting distortion of interference fringes Grant 6,008,904 - Ishii , et al. December 28, 1	1999-12-28
Interferometric surface profiler with an alignment optical member Grant 5,563,706 - Shibuya , et al. October 8, 1	1996-10-08
Exposure method and apparatus using holographic techniques Grant 5,504,596 - Goto , et al. April 2, 1	1996-04-02
Interferometer for measuring aspherical form with the utilization of computer generated hologram Grant 5,039,223 - Gemma , et al. August 13, 1	1991-08-13
Holographic interferometer Grant 4,812,042 - Yokokura , et al. March 14, 1	1989-03-14

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