GE; Zongtao

Patent Applications and Registrations

Patent applications and USPTO patent grants for GE; Zongtao.The latest application filed is for "lightwave interference measurement apparatus".

Company Profile

0.16.23

GE; Zongtao - Saitama JP
GE; Zongtao - Saitama-shi JP
Ge; Zongtao - Omiya JP
Ge, Zongtao - Omiya-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Lightwave Interference Measurement Apparatus App 20110304856 - GE; Zongtao ; et al.	2011-12-15
Optical wave interference measuring apparatus Grant 8,059,278 - Ge , et al. November 15, 2	2011-11-15
Aspheric Surface Measuring Apparatus App 20110242545 - TOMIMIZU; MASAAKI ; et al.	2011-10-06
Optical wave interference measuring apparatus Grant 7,982,882 - Ge , et al. July 19, 2	2011-07-19
Light wave interferometer apparatus Grant 7,880,897 - Ge February 1, 2	2011-02-01
Asphere Measurement Method And Apparatus App 20100309458 - GE; Zongtao ; et al.	2010-12-09
Method Of Measuring Amount Of Eccentricity App 20100245804 - GE; Zongtao ; et al.	2010-09-30
Method And Apparatus Of Measuring Positional Variation Of Rotation Center Line App 20100246900 - GE; Zongtao ; et al.	2010-09-30
Three-dimensional Shape Measuring Method And Device App 20100231923 - GE; Zongtao ; et al.	2010-09-16
Method of measuring amount of eccentricity Grant 7,792,366 - Ge , et al. September 7, 2	2010-09-07
Lightwave Interference Measurement Device App 20100201992 - GE; Zongtao	2010-08-12
Wavefront measuring apparatus for optical pickup Grant 7,719,691 - Ge May 18, 2	2010-05-18
Optical Wave Interference Measuring Apparatus App 20100097619 - GE; Zongtao ; et al.	2010-04-22
Optical Wave Interference Measuring Apparatus App 20100091299 - GE; Zongtao ; et al.	2010-04-15
Omnidirectional Imaging Apparatus App 20090309957 - GE; Zongtao ; et al.	2009-12-17
Light Wave Interferometer Apparatus App 20090168076 - GE; Zongtao	2009-07-02
Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof Grant 7,538,890 - Ge , et al. May 26, 2	2009-05-26
Wavefront Measuring Apparatus For Optical Pickup App 20090073459 - GE; Zongtao	2009-03-19
Sample inclination measuring method Grant 7,245,384 - Ge , et al. July 17, 2	2007-07-17
Low coherent interference fringe analysis method Grant 7,119,907 - Ge October 10, 2	2006-10-10
Wavefront-measuring interferometer apparatus, and light beam measurement apparatus and method thereof App 20050270543 - Ge, Zongtao ; et al.	2005-12-08
Method of extracting circular region from fringe image Grant 6,950,191 - Ge September 27, 2	2005-09-27
Method of assisting sample inclination error adjustment Grant 6,947,149 - Kobayashi , et al. September 20, 2	2005-09-20
Phase shift fringe analysis method and apparatus using the same Grant 6,778,281 - Ge August 17, 2	2004-08-17
Fringe analysis method using fourier transform Grant 6,768,554 - Ge July 27, 2	2004-07-27
Method of detecting posture of object and apparatus using the same Grant 6,707,559 - Ge March 16, 2	2004-03-16
Fringe analysis method using fourier transform Grant 6,693,715 - Ge February 17, 2	2004-02-17
Sample inclination measuring method App 20040001205 - Ge, Zongtao ; et al.	2004-01-01
Method of extracting circular region from fringe image App 20040001195 - Ge, Zongtao	2004-01-01
Low coherent interference fringe analysis method App 20030234938 - Ge, Zongtao	2003-12-25
Method of assisting sample inclination error adjustment App 20030227633 - Kobayashi, Fumio ; et al.	2003-12-11
Fringe analysis method and apparatus using Fourier transform Grant 6,621,579 - Ge September 16, 2	2003-09-16
Fringe analysis error detection method and fringe analysis error correction method Grant 6,532,073 - Ge March 11, 2	2003-03-11
Phase shift fringe analysis method and apparatus using the same App 20020135777 - Ge, Zongtao	2002-09-26
Method of detecting posture of object and apparatus using the same App 20020113973 - Ge, Zongtao	2002-08-22
Fringe analysis error detection method and fringe analysis error correction method App 20020051134 - Ge, Zongtao	2002-05-02
Fringe analysis method using fourier transform App 20010049709 - Ge, Zongtao	2001-12-06
Fringe analysis method and apparatus using fourier transform App 20010030753 - Ge, Zongtao	2001-10-18
Fringe analysis method using fourier transform App 20010019635 - Ge, Zongtao	2001-09-06

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