Garg; Akhil

Patent Applications and Registrations

Patent applications and USPTO patent grants for Garg; Akhil.The latest application filed is for "intermittently bonded ribbon with colored bonds".

Company Profile

3.12.9

Garg; Akhil - Nodia IN
Garg; Akhil - Gurgaon IN
Garg; Akhil - Gurugram IN
Garg; Akhil - Greater Noida IN
Garg; Akhil - Uttar Pradesh IN
Garg; Akhil - Gautam Budh Nagar IN
Garg; Akhil - Dadri IN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scan wrapper architecture for system-on-chip Grant 11,320,485 - Garg , et al. May 3, 2	2022-05-03
Leaf shaped intermittent bonded optical fibre ribbon Grant 11,300,741 - Sahoo , et al. April 12, 2	2022-04-12
Intermittently Bonded Ribbon With Colored Bonds App 20210286143 - Kondapalli; Hemanth ; et al.	2021-09-16
Leaf Shaped Intermittent Bonded Optical Fibre Ribbon App 20210271040 - Sahoo; Kishore ; et al.	2021-09-02
Cable With Interstitial Fillers And Edge Ribbons App 20210041655 - Sahoo; Kishore ; et al.	2021-02-11
Test circuitry with annularly arranged compressor and decompressor elements Grant 10,747,922 - Garg , et al. A	2020-08-18
Securing access to integrated circuit scan mode and data Grant 10,222,417 - Garg , et al.	2019-03-05
Testing of multi-clock domains Grant 8,527,824 - Bahl , et al. September 3, 2	2013-09-03
Testing Of Multi-clock Domains App 20130159802 - BAHL; Swapnil ; et al.	2013-06-20
Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces Grant 8,386,864 - Dubey , et al. February 26, 2	2013-02-26
Testing of multi-clock domains Grant 8,381,051 - Bahl , et al. February 19, 2	2013-02-19
System and method for efficient detection and restoration of data storage array defects Grant 8,352,781 - Garg , et al. January 8, 2	2013-01-08
Locally Synchronous Shared Bist Architecture For Testing Embedded Memories With Asynchronous Interfaces App 20120198291 - Dubey; Prashant ; et al.	2012-08-02
Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces Grant 8,108,744 - Dubey , et al. January 31, 2	2012-01-31
Testing Of Multi-clock Domains App 20110264971 - Bahl; Swapnil ; et al.	2011-10-27
Multiple embedded memories and testing components for the same Grant 7,954,017 - Kashyap , et al. May 31, 2	2011-05-31
System And Method For Efficient Detection And Restoration Of Data Storage Array Defects App 20100017651 - Garg; Akhil ; et al.	2010-01-21
Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces App 20080126892 - Dubey; Prashant ; et al.	2008-05-29
Multiple embedded memories and testing components for the same App 20070162793 - Kashyap; Amit ; et al.	2007-07-12

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