Garbarino; Paul L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Garbarino; Paul L..The latest application filed is for "testing method and structure for leakage current characterization in the manufacture of dynamic ram cells".

Company Profile

0.7.0

Garbarino; Paul L. - Ridgefield CT

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Testing method and structure for leakage current characterization in the manufacture of dynamic RAM cells Grant 4,542,340 - Chakravarti , et al. September 17, 1	1985-09-17
Borderless diffusion contact process and structure Grant 4,409,722 - Dockerty , et al. October 18, 1	1983-10-18
Method of making dense vertical FET's Grant 4,407,058 - Fatula, Jr. , et al. October 4, 1	1983-10-04
FET Memory cell structure and process Grant 4,397,075 - Fatula, Jr. , et al. August 9, 1	1983-08-09
Method for making an electrical contact to a silicon substrate through a relatively thin layer of silicon dioxide on the surface of the substrate Grant 4,341,009 - Bartholomew , et al. July 27, 1	1982-07-27
Method for forming semiconductor structure with improved isolation between two layers of polycrystalline silicon Grant 4,251,571 - Garbarino , et al. February 17, 1	1981-02-17
Making semiconductor structure with improved phosphosilicate glass isolation Grant 4,191,603 - Garbarino , et al. March 4, 1	1980-03-04

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