GAO; Lisheng

Patent Applications and Registrations

Patent applications and USPTO patent grants for GAO; Lisheng.The latest application filed is for "crawling welding robot".

Company Profile

13.62.62

GAO; Lisheng - Beijing CN
Gao; Lisheng - Saratoga CA
Gao; Lisheng - Morgan Hill CA
Gao; Lisheng - Shenzhen CN
Gao; Lisheng - Beijing 100084 CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Crawling Welding Robot App 20220258291 - FENG; Xiaobing ; et al.	2022-08-18
Wafer inspection using difference images Grant 11,270,430 - Sezginer , et al. March 8, 2	2022-03-08
Method and system for correlating optical images with scanning electron microscopy images Grant 11,244,442 - Lee , et al. February 8, 2	2022-02-08
Repeater defect detection Grant 11,204,332 - Shifrin , et al. December 21, 2	2021-12-21
Crawling Welding Robot And Method Of Controlling The Same App 20210291289 - FENG; Xiaobing ; et al.	2021-09-23
Previous layer nuisance reduction through oblique illumination Grant 10,818,005 - Zhong , et al. October 27, 2	2020-10-27
Method and apparatus for generating heatmap Grant 10,783,673 - Gao , et al. Sept	2020-09-22
Repeater Defect Detection App 20200240928 - Shifrin; Eugene ; et al.	2020-07-30
Generating high resolution images from low resolution images for semiconductor applications Grant 10,648,924 - Zhang , et al.	2020-05-12
Repeater defect detection Grant 10,648,925 - Shifrin , et al.	2020-05-12
Systems and methods for detecting defects on a wafer Grant 10,605,744 - Chen , et al.	2020-03-31
Dynamic care areas for defect detection Grant 10,600,175 - Brauer , et al.	2020-03-24
Nuisance reduction using location-based attributes Grant 10,600,177 - Brauer , et al.	2020-03-24
Visual feedback for inspection algorithms and filters Grant 10,599,944 - Lee , et al.	2020-03-24
Automatic recipe stability monitoring and reporting Grant 10,514,685 - Lee , et al. Dec	2019-12-24
Method and System for Correlating Optical Images with Scanning Electron Microscopy Images App 20190333206 - Lee; Hucheng ; et al.	2019-10-31
Previous Layer Nuisance Reduction Through Oblique Illumination App 20190279357 - Zhong; Jingshan ; et al.	2019-09-12
Method and system for correlating optical images with scanning electron microscopy images Grant 10,410,338 - Lee , et al. Sept	2019-09-10
Adaptive local threshold and color filtering Grant 10,395,359 - Huang , et al. A	2019-08-27
Intra-die defect detection Grant 10,393,671 - Thattaisundaram , et al. A	2019-08-27
High sensitivity repeater defect detection Grant 10,395,358 - Brauer , et al. A	2019-08-27
System and method for defining care areas in repeating structures of design data Grant 10,339,262 - Huang , et al.	2019-07-02
Methods and systems for monitoring a non-defect related characteristic of a patterned wafer Grant 10,324,046 - Fu , et al.	2019-06-18
Method and Apparatus For Generating Heatmap App 20190180480 - GAO; Lisheng ; et al.	2019-06-13
Nuisance Reduction Using Location-Based Attributes App 20190050974 - Brauer; Bjorn ; et al.	2019-02-14
Image based specimen process control Grant 10,181,185 - Park , et al. Ja	2019-01-15
Repeater Defect Detection App 20180348147 - Shifrin; Eugene ; et al.	2018-12-06
Wafer Inspection Using Difference Images App 20180342051 - Sezginer; Abdurrahman ; et al.	2018-11-29
Apparatus and methods for finding a best aperture and mode to enhance defect detection Grant 10,132,760 - Kolchin , et al. November 20, 2	2018-11-20
Defect detection and classification based on attributes determined from a standard reference image Grant 10,127,652 - Gao , et al. November 13, 2	2018-11-13
Dynamic Care Areas for Defect Detection App 20180276808 - Brauer; Bjorn ; et al.	2018-09-27
Systems And Methods For Detecting Defects On A Wafer App 20180202943 - Chen; Lu ; et al.	2018-07-19
Optical die to database inspection Grant 10,012,599 - Wells , et al. July 3, 2	2018-07-03
Sub-pixel alignment of inspection to design Grant 9,996,942 - Bhattacharyya , et al. June 12, 2	2018-06-12
High Sensitivity Repeater Defect Detection App 20180130199 - Brauer; Bjorn ; et al.	2018-05-10
Optical die to database inspection Grant 9,915,625 - Gao , et al. March 13, 2	2018-03-13
Systems and methods for detecting defects on a wafer Grant 9,880,107 - Chen , et al. January 30, 2	2018-01-30
Detecting defects on a wafer using defect-specific and multi-channel information Grant 9,846,930 - Wu , et al. December 19, 2	2017-12-19
Alignment of inspection to design using built in targets Grant 9,830,421 - Bhattacharyya , et al. November 28, 2	2017-11-28
Apparatus And Methods For Finding A Best Aperture And Mode To Enhance Defect Detection App 20170307545 - Kolchin; Pavel ; et al.	2017-10-26
System and Method for Defining Care Areas in Repeating Structures of Design Data App 20170286589 - Huang; Junqing ; et al.	2017-10-05
Adaptive Local Threshold and Color Filtering App 20170287128 - Huang; Junqing ; et al.	2017-10-05
Apparatus and methods for finding a best aperture and mode to enhance defect detection Grant 9,726,617 - Kolchin , et al. August 8, 2	2017-08-08
Defect detection using structural information Grant 9,727,047 - Luo , et al. August 8, 2	2017-08-08
Detecting defects on a wafer using defect-specific information Grant 9,721,337 - Wu , et al. August 1, 2	2017-08-01
Context-based inspection for dark field inspection Grant 9,715,725 - Zhang , et al. July 25, 2	2017-07-25
Image Based Specimen Process Control App 20170200264 - Park; Allen ; et al.	2017-07-13
Adaptive local threshold and color filtering Grant 9,704,234 - Huang , et al. July 11, 2	2017-07-11
Generating High Resolution Images From Low Resolution Images For Semiconductor Applications App 20170193680 - Zhang; Jing ; et al.	2017-07-06
Optical Die to Database Inspection App 20170191948 - Gao; Lisheng ; et al.	2017-07-06
Design Based Sampling and Binning for Yield Critical Defects App 20170103517 - Kurada; Satya ; et al.	2017-04-13
Detecting defects on wafers based on 2D scatter plots of values determined for output generated using different optics modes Grant 9,619,876 - Huang , et al. April 11, 2	2017-04-11
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channel Information App 20170091925 - Wu; Kenong ; et al.	2017-03-30
Selecting one or more parameters for inspection of a wafer Grant 9,601,393 - Lee , et al. March 21, 2	2017-03-21
Based sampling and binning for yield critical defects Grant 9,563,943 - Kurada , et al. February 7, 2	2017-02-07
Detecting defects on a wafer using defect-specific and multi-channel information Grant 9,552,636 - Wu , et al. January 24, 2	2017-01-24
Wafer and reticle inspection systems and methods for selecting illumination pupil configurations Grant 9,523,646 - Chen , et al. December 20, 2	2016-12-20
Intra-Die Defect Detection App 20160321800 - Thattaisundaram; Govindarajan ; et al.	2016-11-03
Optical Die to Database Inspection App 20160290934 - Wells; Keith ; et al.	2016-10-06
Sub-Pixel Alignment of Inspection to Design App 20160275672 - Bhattacharyya; Santosh ; et al.	2016-09-22
Wafer And Reticle Inspection Systems And Methods For Selecting Illumination Pupil Configurations App 20160266047 - Chen; Grace H. ; et al.	2016-09-15
Scratch filter for wafer inspection Grant 9,442,077 - Huang , et al. September 13, 2	2016-09-13
Design Based Sampling and Binning for Yield Critical Defects App 20160225138 - Kurada; Satya ; et al.	2016-08-04
Visual Feedback for Inspection Algorithms and Filters App 20160210526 - Lee; Hucheng ; et al.	2016-07-21
Alignment of Inspection to Design Using Built in Targets App 20160188784 - Bhattacharyya; Santosh ; et al.	2016-06-30
Wafer and reticle inspection systems and methods for selecting illumination pupil configurations Grant 9,347,891 - Chen , et al. May 24, 2	2016-05-24
Defect Detection Using Structural Information App 20160104600 - Luo; Qing ; et al.	2016-04-14
Based sampling and binning for yield critical defects Grant 9,310,320 - Kurada , et al. April 12, 2	2016-04-12
Detecting Defects on a Wafer Using Defect-Specific Information App 20160071256 - Wu; Kenong ; et al.	2016-03-10
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channel Information App 20160027165 - Wu; Kenong ; et al.	2016-01-28
Tuning wafer inspection recipes using precise defect locations Grant 9,224,660 - Kulkarni , et al. December 29, 2	2015-12-29
Automatic Recipe Stability Monitoring and Reporting App 20150362908 - Lee; Hucheng ; et al.	2015-12-17
Detecting defects on a wafer using defect-specific information Grant 9,189,844 - Wu , et al. November 17, 2	2015-11-17
Wafer inspection using free-form care areas Grant 9,171,364 - Wu , et al. October 27, 2	2015-10-27
Defect Detection And Classification Based On Attributes Determined From A Standard Reference Image App 20150221076 - Gao; Lisheng ; et al.	2015-08-06
Detecting defects on a wafer using defect-specific and multi-channel information Grant 9,092,846 - Wu , et al. July 28, 2	2015-07-28
Context-Based Inspection for Dark Field Inspection App 20150178907 - Zhang; Yong ; et al.	2015-06-25
Detecting defects on a wafer Grant 9,053,527 - Lang , et al. June 9, 2	2015-06-09
Method and System for Correlating Optical Images with Scanning Electron Microscopy Images App 20150125065 - Lee; Hucheng ; et al.	2015-05-07
Detecting IC Reliability Defects App 20150120220 - Wu; Joanne ; et al.	2015-04-30
Region based virtual fourier filter Grant 8,989,479 - Gao , et al. March 24, 2	2015-03-24
Tuning Wafer Inspection Recipes Using Precise Defect Locations App 20150062571 - Kulkarni; Ashok V. ; et al.	2015-03-05
Scratch Filter for Wafer Inspection App 20150063677 - Huang; Junqing ; et al.	2015-03-05
Adaptive Local Threshold and Color Filtering App 20150043804 - Huang; Junqing ; et al.	2015-02-12
Wafer And Reticle Inspection Systems And Methods For Selecting Illumination Pupil Configurations App 20150015874 - Chen; Grace H. ; et al.	2015-01-15
Wafer Inspection Using Free-Form Care Areas App 20140376802 - Wu; Kenong ; et al.	2014-12-25
Apparatus And Methods For Finding A Best Aperture And Mode To Enhance Defect Detection App 20140354983 - Kolchin; Pavel ; et al.	2014-12-04
Design Based Sampling and Binning for Yield Critical Defects App 20140307947 - Kurada; Satya ; et al.	2014-10-16
Detecting Defects on a Wafer App 20140270474 - Huang; Junqing ; et al.	2014-09-18
Detecting Defects on a Wafer Using Defect-Specific and Multi-Channel Information App 20140219544 - Wu; Kenong ; et al.	2014-08-07
Detecting defects on a wafer Grant 8,775,101 - Huang , et al. July 8, 2	2014-07-08
Detecting Defects on a Wafer App 20140185919 - Lang; Jun ; et al.	2014-07-03
Detecting Defects on a Wafer Using Defect-Specific Information App 20140105482 - Wu; Kenong ; et al.	2014-04-17
Systems and Methods for Detecting Defects on a Wafer App 20130250287 - Chen; Lu ; et al.	2013-09-26
Computer-implemented methods and systems for classifying defects on a specimen Grant 8,532,949 - Teh , et al. September 10, 2	2013-09-10
Systems and methods for detecting defects on a wafer Grant 8,467,047 - Chen , et al. June 18, 2	2013-06-18
Detecting Defects On A Wafer App 20130035876 - Huang; Junqing ; et al.	2013-02-07
Systems and Methods for Detecting Defects on a Wafer App 20120268735 - Chen; Lu ; et al.	2012-10-25
Systems and methods for detecting defects on a wafer Grant 8,223,327 - Chen , et al. July 17, 2	2012-07-17
Region Based Virtual Fourier Filter App 20120141013 - Gao; Lisheng ; et al.	2012-06-07
Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle Grant 8,111,900 - Wu , et al. February 7, 2	2012-02-07
Selecting One or More Parameters for Inspection of a Wafer App 20110320149 - Lee; Chris ; et al.	2011-12-29
Adaptive signature detection Grant 8,059,886 - Gao , et al. November 15, 2	2011-11-15
Computer-implemented methods, carrier media, and systems for selecting polarization settings for an inspection system Grant 8,049,877 - Wallingford , et al. November 1, 2	2011-11-01
Adaptive Signature Detection App 20110170766 - Gao; Yong ; et al.	2011-07-14
Computer-implemented Methods For Detecting And/or Sorting Defects In A Design Pattern Of A Reticle App 20100226562 - Wu; Kenong ; et al.	2010-09-09
Systems And Methods For Detecting Defects On A Wafer App 20100188657 - Chen; Lu ; et al.	2010-07-29
Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle Grant 7,729,529 - Wu , et al. June 1, 2	2010-06-01
Computer-implemented Methods, Carrier Media, And Systems For Selecting Polarization Settings For An Inspection System App 20090284733 - Wallingford; Richard ; et al.	2009-11-19
Control method and system for a trackless autonomous crawling all-position arc welding robot with wheels and permanent magnet caterpillar belts Grant 7,498,542 - Pan , et al. March 3, 2	2009-03-03
Automatic supervised classifier setup tool for semiconductor defects Grant 7,359,544 - Gao , et al. April 15, 2	2008-04-15
Computer-implemented methods for detecting and/or sorting defects in a design pattern of a reticle App 20060291714 - Wu; Kenong ; et al.	2006-12-28
Flexible hybrid defect classification for semiconductor manufacturing Grant 7,142,992 - Huet , et al. November 28, 2	2006-11-28
Flexible Hybrid Defect Classification For Semiconductor Manufacturing App 20060265145 - Huet; Patrick ; et al.	2006-11-23
Control method and system for a trackless autonomous crawling all-position arc welding robot with wheels and permanent magnet caterpillar belts App 20060144835 - Pan; Jiluan ; et al.	2006-07-06
Computer-implemented methods and systems for classifying defects on a specimen App 20060082763 - Teh; Cho Huak ; et al.	2006-04-20
Automatic supervised classifier setup tool for semiconductor defects App 20040156540 - Gao, Lisheng ; et al.	2004-08-12

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.