Futrell; John R. C.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Futrell; John R. C..The latest application filed is for "methods for defining evaluation points for optical proximity correction and optical proximity correction methods including same".

Company Profile

0.13.11

Futrell; John R. C. - Boise ID

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods for defining evaluation points for optical proximity correction and optical proximity correction methods including same Grant 8,584,058 - Futrell , et al. November 12, 2	2013-11-12
Methods For Defining Evaluation Points For Optical Proximity Correction And Optical Proximity Correction Methods Including Same App 20120030638 - Futrell; John R.C. ; et al.	2012-02-02
Methods for defining evaluation points for optical proximity correction and optical proximity correction methods including same Grant 8,037,446 - Futrell , et al. October 11, 2	2011-10-11
Methods For Defining Evaluation Points For Optical Proximity Correction And Optical Proximity Correction Methods Including Same App 20100017778 - Futrell; John R. C. ; et al.	2010-01-21
Method and device for checking lithography data Grant 7,549,142 - Alvarez-Gomariz , et al. June 16, 2	2009-06-16
Method and device for checking lithography data Grant 7,549,143 - Alvarez-Gomariz , et al. June 16, 2	2009-06-16
Methods of forming patterned reticles Grant 7,350,182 - Dulman , et al. March 25, 2	2008-03-25
Method And Device For Checking Lithography Data App 20060234140 - Alvarez-Gomariz; Husayn ; et al.	2006-10-19
Method And Device For Checking Lithography Data App 20060235663 - Alvarez-Gomariz; Husayn ; et al.	2006-10-19
Methods of forming patterned reticles Grant 7,107,572 - Dulman , et al. September 12, 2	2006-09-12
Method and device for checking lithography data Grant 7,096,452 - Alvarez-Gomariz , et al. August 22, 2	2006-08-22
Methods of forming patterned reticles Grant 7,093,227 - Dulman , et al. August 15, 2	2006-08-15
Methods of forming patterned reticles Grant 7,086,031 - Dulman , et al. August 1, 2	2006-08-01
Methods of forming patterned reticles Grant 7,073,161 - Dulman , et al. July 4, 2	2006-07-04
Methods of forming patterned reticles App 20050008951 - Dulman, H. Daniel ; et al.	2005-01-13
Methods of forming patterned reticles App 20050008949 - Dulman, H. Daniel ; et al.	2005-01-13
Methods of forming patterned reticles App 20050008952 - Dulman, H. Daniel ; et al.	2005-01-13
Methods of forming patterned reticles App 20050008953 - Dulman, H. Daniel ; et al.	2005-01-13
Methods of forming patterned reticles App 20050008950 - Dulman, H. Daniel ; et al.	2005-01-13
Methods of forming patterned reticles Grant 6,842,889 - Dulman , et al. January 11, 2	2005-01-11
Method and device for checking lithography data App 20040268291 - Alvarez-Gomariz, Husayn ; et al.	2004-12-30
Methods of forming patterned reticles App 20040031013 - Dulman, H. Daniel ; et al.	2004-02-12
Method of making a metallized recess in a substrate Grant 6,169,021 - Akram , et al. January 2, 2	2001-01-02

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.