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Patent applications and USPTO patent grants for Futamura; Ikuo.The latest application filed is for "component mounting system and adhesive inspection device".
Patent | Date |
---|---|
Substrate inspection device that inspects application quality of adhesive Grant 11,452,250 - Futamura , et al. September 20, 2 | 2022-09-20 |
Component mounting system and adhesive inspection device Grant 11,039,561 - Futamura , et al. June 15, 2 | 2021-06-15 |
Three-dimensional measuring device Grant 10,563,977 - Ohyama , et al. Feb | 2020-02-18 |
Component Mounting System And Adhesive Inspection Device App 20200015396 - Futamura; Ikuo ;   et al. | 2020-01-09 |
Substrate Inspection Device, Substrate Inspection Method And Method Of Manufacturing Substrate App 20190364707 - Futamura; Ikuo ;   et al. | 2019-11-28 |
Three-dimensional Measuring Device App 20190025048 - Ohyama; Tsuyoshi ;   et al. | 2019-01-24 |
Three-dimensional measuring instrument Grant 7,245,387 - Mamiya , et al. July 17, 2 | 2007-07-17 |
Three-dimensional measuring instrument App 20050254066 - Mamiya, Takahiro ;   et al. | 2005-11-17 |
Shape measuring device Grant 6,075,605 - Futamura , et al. June 13, 2 | 2000-06-13 |
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