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Non-volatile semiconductor memory
Grant 8,279,673 - Furuyama October 2, 2 | 2012-10-02 |
Nonvolatile memory device having a plurality of memory blocks
Grant 8,094,478 - Furuyama , et al. January 10, 2 | 2012-01-10 |
Time reduction of address setup/hold time for semiconductor memory
Grant 8,031,537 - Niimi , et al. October 4, 2 | 2011-10-04 |
Method and apparatus for address allotting and verification in a semiconductor device
Grant 8,023,341 - Kawabata , et al. September 20, 2 | 2011-09-20 |
Time Reduction Of Address Setup/hold Time For Semiconductor Memory
App 20110103157 - NIIMI; Makoto ; et al. | 2011-05-05 |
Time reduction of address setup/hold time for semiconductor memory
Grant 7,889,573 - Niimi , et al. February 15, 2 | 2011-02-15 |
Method And Apparatus For Address Allotting And Verification In A Semiconductor Device
App 20110026287 - KAWABATA; Shozo ; et al. | 2011-02-03 |
Nonvolatile Memory Device Having A Plurality Of Memory Blocks
App 20110002177 - FURUYAMA; Takaaki ; et al. | 2011-01-06 |
Method and apparatus for address allotting and verification in a semiconductor device
Grant 7,813,154 - Kawabata , et al. October 12, 2 | 2010-10-12 |
Nonvolatile memory device having a plurality of memory blocks
Grant 7,808,808 - Furuyama , et al. October 5, 2 | 2010-10-05 |
Non-volatile Semiconductor Memory
App 20100157677 - FURUYAMA; Takaaki | 2010-06-24 |
Time Reduction Of Address Setup/hold Time For Semiconductor Memory
App 20090323435 - Niimi; Makoto ; et al. | 2009-12-31 |
Nonvolatile Memory Device Having A Plurality Of Memory Blocks
App 20090034334 - FURUYAMA; Takaaki ; et al. | 2009-02-05 |
Method And Apparatus For Address Allotting And Verification In A Semiconductor Device
App 20080316787 - KAWABATA; Shozo ; et al. | 2008-12-25 |
Method for fabricating a semiconductor device
Grant 7,452,771 - Ito , et al. November 18, 2 | 2008-11-18 |
Method and apparatus for address allotting and verification in a semiconductor device
Grant 7,433,219 - Kawabata , et al. October 7, 2 | 2008-10-07 |
Method and apparatus for initialization control in a non-volatile memory device
Grant 7,415,568 - Kawabata , et al. August 19, 2 | 2008-08-19 |
Memory device and control method therefor
Grant 7,321,515 - Shimbayashi , et al. January 22, 2 | 2008-01-22 |
Memory system and test method therefor
Grant 7,281,180 - Furuyama , et al. October 9, 2 | 2007-10-09 |
Method and apparatus for applying bias to a storage device
Grant 7,239,548 - Kato , et al. July 3, 2 | 2007-07-03 |
Non-volatile memory and write method of the same
Grant 7,212,443 - Furuyama May 1, 2 | 2007-05-01 |
Method and apparatus for applying bias to a storage device
App 20060227630 - Kato; Kenta ; et al. | 2006-10-12 |
Memory device and control method therefor
App 20060227629 - Shimbayashi; Koji ; et al. | 2006-10-12 |
Method and apparatus for address allotting and verification in a semiconductor device
App 20060209583 - Kawabata; Shozo ; et al. | 2006-09-21 |
Semiconductor memory storage device and a redundancy control method therefor
Grant 7,068,555 - Sugimoto , et al. June 27, 2 | 2006-06-27 |
Semiconductor memory storage device and its redundant method
Grant 7,061,816 - Sugiura , et al. June 13, 2 | 2006-06-13 |
Method for fabricating a semiconductor device
App 20060046373 - Ito; Masaki ; et al. | 2006-03-02 |
Method and apparatus for initialization control in a non-volatile memory device
App 20060023500 - Kawabata; Shozo ; et al. | 2006-02-02 |
Memory system and test method therefor
App 20060002196 - Furuyama; Takaaki ; et al. | 2006-01-05 |
Semiconductor device comprising transistors having control gates and floating gate electrodes
Grant 6,977,411 - Ito , et al. December 20, 2 | 2005-12-20 |
Semiconductor memory storage device and its redundant method
App 20050185483 - Sugiura, Akira ; et al. | 2005-08-25 |
Semiconductor memory storage device and a redundancy control method therefor
App 20050185482 - Sugimoto, Satoru ; et al. | 2005-08-25 |
Nonvolatile semiconductor memory device
Grant 6,917,541 - Shimbayashi , et al. July 12, 2 | 2005-07-12 |
Semiconductor device and method for testing the same
App 20050149792 - Furuyama, Takaaki | 2005-07-07 |
Non-volatile memory and write method of the same
App 20050141277 - Furuyama, Takaaki | 2005-06-30 |
Threshold voltage adjustment method of non-volatile semiconductor memory device and non-volatile semiconductor memory device
Grant 6,879,521 - Furuyama April 12, 2 | 2005-04-12 |
Semiconductor device and method for fabricating the same
App 20040129970 - Ito, Masaki ; et al. | 2004-07-08 |
Threshold voltage adjustment method of non-volatile semiconductor memory device and non-volatile semiconductor memory device
App 20040008567 - Furuyama, Takaaki | 2004-01-15 |
Flash memory capable of changing bank configuration
Grant 6,643,758 - Furuyama , et al. November 4, 2 | 2003-11-04 |
Nonvolatile semiconductor memory device
App 20030043623 - Shimbayashi, Koji ; et al. | 2003-03-06 |
Flash memory capable of changing bank configuration
App 20020161962 - Furuyama, Takaaki ; et al. | 2002-10-31 |
Semiconductor memory device and refreshing method of semiconductor memory device
App 20010043499 - Komura, Kazufumi ; et al. | 2001-11-22 |
Data writing method for semiconductor memory device
Grant 6,310,825 - Furuyama October 30, 2 | 2001-10-30 |
Circuit for resetting a pair of data buses of a semiconductor memory device
App 20010001261 - Sugamoto, Hiroyuki ; et al. | 2001-05-17 |
DRAM with reduced electric power consumption
Grant 6,097,658 - Satoh , et al. August 1, 2 | 2000-08-01 |
DRAM with reduced electric power consumption
Grant 5,867,438 - Nomura , et al. February 2, 1 | 1999-02-02 |
Semiconductor memory device provided with block write function
Grant 5,787,046 - Furuyama , et al. July 28, 1 | 1998-07-28 |
DRAM with reduced electric power consumption
Grant 5,594,699 - Nomura , et al. January 14, 1 | 1997-01-14 |
Dynamic random access memory having dummy word line for facilitating reset of row address latch
Grant 4,989,182 - Mochizuki , et al. January 29, 1 | 1991-01-29 |
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