Furuya; Toshihiro
Patent Applications and Registrations
Patent applications and USPTO patent grants for Furuya; Toshihiro.The latest application filed is for "scanning electron microscope and method of processing the same".
- Furuya; Toshihiro - Katsuta
| Patent | Date |
|---|---|
| Scanning electron microscope and method of processing the same Grant 5,001,344 - Kato , et al. March 19, 1 | 1991-03-19 |
| Image correction system for scanning electron microscope Grant 4,907,287 - Homma , et al. March 6, 1 | 1990-03-06 |
| Scanning electron microscope Grant 4,803,358 - Kato , et al. February 7, 1 | 1989-02-07 |
| Electron beam scanning method and scanning electron microscope Grant 4,791,294 - Furuya December 13, 1 | 1988-12-13 |
| Photometric stereoscopic shape measuring method Grant 4,755,047 - Kato , et al. July 5, 1 | 1988-07-05 |
| Sample surface structure measuring method Grant 4,733,074 - Kato , et al. March 22, 1 | 1988-03-22 |
| Specimen image display apparatus Grant 4,385,317 - Furuya , et al. May 24, 1 | 1983-05-24 |
| Method Of And Apparatus For Attaining Focusing Following Variation In Magnification In Electron Microscope Grant 3,715,582 - Akahori , et al. February 6, 1 | 1973-02-06 |
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