Furuya; Kunihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Furuya; Kunihiro.The latest application filed is for "wafer inspection system".

Company Profile

6.12.12

Furuya; Kunihiro - Nirasaki JP
Furuya; Kunihiro - Nirasaki City JP
Furuya; Kunihiro - Yamanashi JP
Furuya; Kunihiro - Nirasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Position correction method, inspection apparatus, and probe card Grant 11,119,122 - Furuya , et al. September 14, 2	2021-09-14
Wafer inspection system, wafer inspection apparatus and prober Grant 11,061,071 - Hagihara , et al. July 13, 2	2021-07-13
Wafer Inspection System App 20210190861 - Hagihara; Junichi ; et al.	2021-06-24
Test head and wafer inspection apparatus Grant 10,976,364 - Hagihara , et al. April 13, 2	2021-04-13
Wafer Inspection System, Wafer Inspection Apparatus And Prober App 20200400743 - Hagihara; Junichi ; et al.	2020-12-24
Test Head And Wafer Inspection Apparatus App 20200348358 - Hagihara; Junichi ; et al.	2020-11-05
Wafer inspection system, wafer inspection apparatus and prober Grant 10,753,972 - Hagihara , et al. A	2020-08-25
Wafer Inspection System, Wafer Inspection Apparatus And Prober App 20200064400 - Hagihara; Junichi ; et al.	2020-02-27
Position Correction Method, Inspection Apparatus, and Probe Card App 20190277884 - FURUYA; Kunihiro ; et al.	2019-09-12
Method of contacting substrate with probe card Grant 9,863,977 - Furuya , et al. January 9, 2	2018-01-09
Wafer Inspection System, Wafer Inspection Apparatus And Prober App 20170234924 - Hagihara; Junichi ; et al.	2017-08-17
Maintenance carriage for wafer inspection apparatus and maintenance method for wafer inspection apparatus Grant 9,671,459 - Hagihara , et al. June 6, 2	2017-06-06
Support body for contact terminals and probe card Grant 9,140,726 - Mochizuki , et al. September 22, 2	2015-09-22
Method Of Contacting Substrate With Probe Card App 20150219687 - Furuya; Kunihiro ; et al.	2015-08-06
Maintenance Carriage For Wafer Inspection Apparatus And Maintenance Method For Wafer Inspection Apparatus App 20150115991 - Hagihara; Junichi ; et al.	2015-04-30
Support Body For Contact Terminals And Probe Card App 20130093446 - MOCHIZUKI; Jun ; et al.	2013-04-18
Contact structure for inspection Grant 8,310,257 - Takase , et al. November 13, 2	2012-11-13
Contact Structure For Inspection App 20110043232 - TAKASE; Shinichiro ; et al.	2011-02-24
Probe method, prober, and electrode reducing/plasma-etching processing mechanism Grant 7,750,654 - Okumura , et al. July 6, 2	2010-07-06
Probe pins zero-point detecting method, and prober Grant 7,023,226 - Okumura , et al. April 4, 2	2006-04-04
Probe method, prober, and electrode reducing/plasma-etching processing mechanism App 20050151549 - Okumura, Katsuya ; et al.	2005-07-14
Probe pins zero-point detecting method, and prober App 20050052195 - Okumura, Katsuya ; et al.	2005-03-10
Semiconductor wafer holder with spring-mounted temperature measurement apparatus disposed therein Grant 6,084,215 - Furuya , et al. July 4, 2	2000-07-04
Inspection apparatus, transportation apparatus, and temperature control apparatus Grant 5,708,222 - Yonezawa , et al. January 13, 1	1998-01-13

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