Furno; Joseph J.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Furno; Joseph J..The latest application filed is for "image scanning and processing system".

Company Profile

0.7.10

Furno; Joseph J. - Rochester NY
Furno; Joseph J. - Pittsford NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image processing method Grant 8,675,236 - Lathrop , et al. March 18, 2	2014-03-18
Image Processing Method App 20130194620 - Lathrop; George E. ; et al.	2013-08-01
Image Scanning And Processing System App 20130194615 - Lathrop; George E. ; et al.	2013-08-01
Method and system for component replacement based on use and error correlation Grant 7,127,185 - Doty , et al. October 24, 2	2006-10-24
Initialization method for establishing process control parameters Grant 7,054,567 - Furno , et al. May 30, 2	2006-05-30
Method and system for component replacement based on use and error correlation App 20060039708 - Doty; Kenneth T. ; et al.	2006-02-23
Replaceable component life tracking for idled components in an electrophotographic print engine App 20060025967 - Furno; Joseph J. ; et al.	2006-02-02
Formation of uniform density patches in an electrographic reproduction apparatus for process control Grant 6,915,087 - Furno , et al. July 5, 2	2005-07-05
High voltage bias feedback for diagnostic purposes Grant 6,813,128 - Hasenauer , et al. November 2, 2	2004-11-02
Formation of uniform density patches in an electrographic reproduction apparatus for process control App 20040096231 - Furno, Joseph J. ; et al.	2004-05-20
Intitialization method for establishing process control parameters App 20040096230 - Furno, Joseph J. ; et al.	2004-05-20
Adjustable automatic process control density patch location detection Grant 6,684,035 - Furno , et al. January 27, 2	2004-01-27
Adjustable Automatic Process Control Density Patch Location Detection App 20030235418 - Furno, Joseph J. ; et al.	2003-12-25
High voltage bias feedback for diagnostic purposes App 20030035258 - Hasenauer, Charles H. ; et al.	2003-02-20

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