FURMAN; Dov
Patent Applications and Registrations
Patent applications and USPTO patent grants for FURMAN; Dov.The latest application filed is for "methods and systems of holographic interferometry".
Company Profile
0.22.31
- FURMAN; Dov - Rehovot IL
- Furman; Dov - Tel Aviv US
Patent Activity
| Patent | Date |
|---|---|
| Methods And Systems Of Holographic Interferometry App 20220018649 - FURMAN; Dov | 2022-01-20 |
| Methods and systems of holographic interferometry Grant 10,725,428 - Furman | 2020-07-28 |
| Methods And Systems Of Holographic Interferometry App 20200141715 - FURMAN; Dov | 2020-05-07 |
| Methods And Systems Of Holographic Interferometry App 20180348703 - FURMAN; Dov | 2018-12-06 |
| Adjustable Wide Bandwidth Guidewave (gw) Probe For Tube And Pipe Inspection Systems App 20180164255 - Conforti; Eyal ; et al. | 2018-06-14 |
| Non-traversing tube inspection system Grant 9,958,417 - Amir , et al. May 1, 2 | 2018-05-01 |
| Adjustable Wide Bandwidth Guidedwave (gw) Probe For Tube And Pipe Inspection System App 20170010179 - Conforti; Eyal ; et al. | 2017-01-12 |
| Wide Bandwidth Gw Probe For Tube And Pipe Inspection System App 20150253238 - Furman; Dov | 2015-09-10 |
| Non-traversing Tube Inspection System App 20150122030 - Amir; Noam ; et al. | 2015-05-07 |
| Handheld probe for tube inspection using APR Grant 8,960,007 - Furman , et al. February 24, 2 | 2015-02-24 |
| Handheld Probe For Tube Inspection Using Apr App 20120227501 - Furman; Dov ; et al. | 2012-09-13 |
| System for detection of wafer defects Grant 7,961,763 - Furman , et al. June 14, 2 | 2011-06-14 |
| Optical inspection tools featuring light shaping diffusers Grant 7,843,558 - Furman November 30, 2 | 2010-11-30 |
| System for detection of wafer defects Grant 7,843,559 - Furman , et al. November 30, 2 | 2010-11-30 |
| Inspection tools supporting multiple operating states for multiple detector arrangements Grant 7,826,049 - Furman , et al. November 2, 2 | 2010-11-02 |
| Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images Grant 7,804,993 - Dorphan , et al. September 28, 2 | 2010-09-28 |
| Multi mode inspection method and apparatus Grant 7,804,590 - Furman , et al. September 28, 2 | 2010-09-28 |
| Image splitting in optical inspection systems Grant 7,719,674 - Furman , et al. May 18, 2 | 2010-05-18 |
| Image splitting in optical inspection systems Grant 7,714,998 - Furman , et al. May 11, 2 | 2010-05-11 |
| Bone age assessment using ultrasound Grant 7,678,049 - Tsoref , et al. March 16, 2 | 2010-03-16 |
| Wafer inspection using short-pulsed continuous broadband illumination Grant 7,659,973 - Furman , et al. February 9, 2 | 2010-02-09 |
| Optical Inspection Tools Featuring Light Shaping Diffusers App 20090323053 - Furman; Dov | 2009-12-31 |
| Apparatus for determining optimum position of focus of an imaging system Grant 7,633,041 - Furman , et al. December 15, 2 | 2009-12-15 |
| Wafer Inspection Using Short-pulsed Continuous Broadband Illumination App 20090225307 - Furman; Dov ; et al. | 2009-09-10 |
| Inspection Tools Supporting Multiple Operating States for Multiple Detector Arrangements App 20090201494 - Furman; Dov ; et al. | 2009-08-13 |
| System for detection of water defects Grant 7,525,659 - Furman , et al. April 28, 2 | 2009-04-28 |
| Multi mode inspection method and apparatus App 20090091749 - Furman; Dov ; et al. | 2009-04-09 |
| Fiber optical illumination system Grant 7,486,861 - Furman February 3, 2 | 2009-02-03 |
| Multi mode inspection method and apparatus Grant 7,480,039 - Furman , et al. January 20, 2 | 2009-01-20 |
| System for detection of wafer defects Grant 7,477,383 - Furman , et al. January 13, 2 | 2009-01-13 |
| Image Splitting in Optical Inspection Systems App 20080137074 - Furman; Dov ; et al. | 2008-06-12 |
| Image Splitting in Optical Inspection Systems App 20080137073 - Furman; Dov ; et al. | 2008-06-12 |
| Speckle reduction using a fiber bundle and light guide App 20080037933 - Furman; Dov ; et al. | 2008-02-14 |
| Multi mode inspection method and apparatus App 20070291256 - Furman; Dov ; et al. | 2007-12-20 |
| Wafer Inspection Using Short-Pulsed Continuous Broadband Illumination App 20070273945 - Furman; Dov ; et al. | 2007-11-29 |
| Multi mode inspection method and apparatus Grant 7,274,444 - Furman , et al. September 25, 2 | 2007-09-25 |
| Fiber optical illumination system Grant 7,260,298 - Furman , et al. August 21, 2 | 2007-08-21 |
| Fiber optical illumination system App 20070146694 - Furman; Dov ; et al. | 2007-06-28 |
| System for detection of wafer defects App 20070019856 - Furman; Dov ; et al. | 2007-01-25 |
| System for detection of wafer defects App 20070013903 - Furman; Dov ; et al. | 2007-01-18 |
| System for detection of wafer defects App 20060244958 - Furman; Dov ; et al. | 2006-11-02 |
| System for detection of wafer defects App 20060244956 - Furman; Dov ; et al. | 2006-11-02 |
| System for detection of wafer defects App 20060244957 - Furman; Dov ; et al. | 2006-11-02 |
| Method and apparatus for detecting defects in wafers including alignment of the wafer images so as to induce the same smear in all images App 20060193506 - Dorphan; Yuval ; et al. | 2006-08-31 |
| Multi mode inspection method and apparatus App 20060007434 - Furman; Dov ; et al. | 2006-01-12 |
| Fiber optical illumination system App 20050180707 - Furman, Dov ; et al. | 2005-08-18 |
| System for detection of wafer defects App 20050110987 - Furman, Dov ; et al. | 2005-05-26 |
| Fiber optical illumination system Grant 6,892,013 - Furman , et al. May 10, 2 | 2005-05-10 |
| System for detection of wafer defects App 20040146295 - Furman, Dov ; et al. | 2004-07-29 |
| Fiber optical illumination system App 20040136665 - Furman, Dov ; et al. | 2004-07-15 |
| Bone age assessment using ultrasound App 20030065264 - Tsoref, Liat ; et al. | 2003-04-03 |
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