Funakoshi; Tomohiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for Funakoshi; Tomohiro.The latest application filed is for "sample observation device".

Company Profile

0.21.24

Funakoshi; Tomohiro - Tokyo JP
Funakoshi; Tomohiro - Hitachinaka N/A JP
Funakoshi, Tomohiro - Allen TX

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Sample observation device having a selectable acceleration voltage Grant 10,141,159 - Doi , et al. Nov	2018-11-27
Charged particle beam device and overlay misalignment measurement method Grant 9,224,575 - Yamamoto , et al. December 29, 2	2015-12-29
Sample Observation Device App 20150371816 - DOI; Ayumi ; et al.	2015-12-24
Charged Particle Beam Device and Overlay Misalignment Measurement Method App 20150287569 - Yamamoto; Takuma ; et al.	2015-10-08
Defect image processing apparatus, defect image processing method, semiconductor defect classifying apparatus, and semiconductor defect classifying method Grant 8,995,748 - Sakai , et al. March 31, 2	2015-03-31
Pattern inspection method, pattern inspection program, and electronic device inspection system Grant 8,653,456 - Toyoda , et al. February 18, 2	2014-02-18
Image classification standard update method, program, and image classification device Grant 8,625,906 - Isomae , et al. January 7, 2	2014-01-07
Surface Inspection Tool And Surface Inspection Method App 20130258351 - MIYOSHI; Yuji ; et al.	2013-10-03
Observation condition determination support device and observation condition determination support method Grant 8,472,696 - Konishi , et al. June 25, 2	2013-06-25
Surface inspection tool and surface inspection method Grant 8,462,352 - Miyoshi , et al. June 11, 2	2013-06-11
Defect inspection method and defect inspection system Grant 8,358,406 - Ikota , et al. January 22, 2	2013-01-22
Pattern Inspection Method, Pattern Inspection Program, and Electronic Device Inspection System App 20120305767 - Toyoda; Yasutaka ; et al.	2012-12-06
Surface Inspection Tool And Surface Inspection Method App 20120262723 - MIYOSHI; Yuji ; et al.	2012-10-18
Analyzing apparatus, program, defect inspection apparatus, defect review apparatus, analysis system, and analysis method Grant 8,290,241 - Ono , et al. October 16, 2	2012-10-16
Defect Review Support Device, Defect Review Device And Inspection Support Device App 20120233542 - Funakoshi; Tomohiro	2012-09-13
Wafer inspection data handling and defect review tool Grant 8,209,135 - Funakoshi , et al. June 26, 2	2012-06-26
Defect Image Processing Apparatus, Defect Image Processing Method, Semiconductor Defect Classifying Apparatus, And Semiconductor Defect Classifying Method App 20120141011 - Sakai; Tsunehiro ; et al.	2012-06-07
Surface inspection tool and surface inspection method Grant 8,189,205 - Miyoshi , et al. May 29, 2	2012-05-29
Observation Condition Determination Support Device And Observation Condition Determination Support Method App 20110311125 - Konishi; Junko ; et al.	2011-12-22
Image Classification Standard Update Method, Program, And Image Classification Device App 20110274362 - Isomae; Yuya ; et al.	2011-11-10
Surface defect data display and management system and a method of displaying and managing a surface defect data Grant 8,041,443 - Funakoshi October 18, 2	2011-10-18
Wafer Inspection Data Handling And Defect Review Tool App 20110211060 - FUNAKOSHI; Tomohiro ; et al.	2011-09-01
Data Processing System, Data Processing Method, And Inspection Assist System App 20110150318 - Funakoshi; Tomohiro ; et al.	2011-06-23
Surface Inspection Tool And Surface Inspection Method App 20110090512 - MIYOSHI; Yuji ; et al.	2011-04-21
Surface inspection tool and surface inspection method Grant 7,884,948 - Miyoshi , et al. February 8, 2	2011-02-08
Recipe parameter management system and recipe parameter management method Grant 7,885,789 - Funakoshi February 8, 2	2011-02-08
Surface Defect Data Display And Management System And A Method Of Displaying And Managing A Surface Defect Data App 20090292387 - FUNAKOSHI; TOMOHIRO	2009-11-26
Recipe Parameter Management System And Recipe Parameter Management Method App 20090281755 - Funakoshi; Tomohiro	2009-11-12
Data processing equipment, inspection assistance system, and data processing method Grant 7,606,409 - Funakoshi October 20, 2	2009-10-20
Surface Inspection Tool And Surface Inspection Method App 20090185178 - Miyoshi; Yuji ; et al.	2009-07-23
Defect Inspection Method And Defect Inspection System App 20090180109 - Ikota; Masami ; et al.	2009-07-16
Data Processing Apparatus And Data Processing Method App 20080298669 - Funakoshi; Tomohiro ; et al.	2008-12-04
Inspection Assistance System, Data Processing Equipment, and Data Processing Method App 20080240545 - ENDO; Fumiaki ; et al.	2008-10-02
Analyzing Apparatus, Program, Defect Inspection Apparatus, Defect Review Apparatus, Analysis System, And Analysis Method App 20080226153 - ONO; Makoto ; et al.	2008-09-18
Data Processor and Data Processing Method App 20080226158 - ABE; Chikako ; et al.	2008-09-18
Method of reviewing defects and an apparatus thereon App 20080123936 - Funakoshi; Tomohiro	2008-05-29
Wafer inspection data handling and defect review tool App 20070105245 - Funakoshi; Tomohiro ; et al.	2007-05-10
Data processing equipment, inspection assistance system, and data processing method App 20060111879 - Funakoshi; Tomohiro	2006-05-25
Rapid chemical vapor deposition for spherical semiconductor processing App 20020068463 - Funakoshi, Tomohiro ; et al.	2002-06-06

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