| Patent | Date |
|---|
Semiconductor device with impurity-doped region and method of fabricating the same
Grant 10,332,878 - Fukutome | 2019-06-25 |
Semiconductor Devices And Methods Of Manufacturing The Same
App 20190035788 - KIM; MUN-HYEON ; et al. | 2019-01-31 |
Semiconductor Device And Method Of Manufacturing The Semiconductor Device
App 20180294195 - Fukutome; Hidenobu ; et al. | 2018-10-11 |
Semiconductor Device And Method Of Manufacturing The Semiconductor Device
App 20170365528 - Fukutome; Hidenobu ; et al. | 2017-12-21 |
Semiconductor device and fabricating method thereof
Grant 9,842,909 - Maeda , et al. December 12, 2 | 2017-12-12 |
Semiconductor device, method of manufacturing the same, and method of evaluating semiconductor device
Grant 9,825,171 - Fukutome , et al. November 21, 2 | 2017-11-21 |
Semiconductor device and method of manufacturing the semiconductor device
Grant 9,786,565 - Fukutome , et al. October 10, 2 | 2017-10-10 |
Semiconductor Devices And Methods Of Manufacturing The Same
App 20170162574 - KIM; MUN-HYEON ; et al. | 2017-06-08 |
Semiconductor Device With Impurity-doped Region And Method Of Fabricating The Same
App 20170117278 - Fukutome; Hidenobu | 2017-04-27 |
Semiconductor device with impurity-doped region and method of fabricating the same
Grant 9,559,101 - Fukutome January 31, 2 | 2017-01-31 |
Semiconductor Device, Method Of Manufacturing The Same, And Method Of Evaluating Semiconductor Device
App 20160351714 - Fukutome; Hidenobu ; et al. | 2016-12-01 |
Semiconductor device, method of manufacturing the same, and method of evaluating semiconductor device
Grant 9,437,737 - Fukutome , et al. September 6, 2 | 2016-09-06 |
Semiconductor Device and Fabricating Method Thereof
App 20160155816 - Maeda; Shigenobu ; et al. | 2016-06-02 |
Semiconductor device and fabricating method thereof
Grant 9,276,116 - Maeda , et al. March 1, 2 | 2016-03-01 |
Semiconductor device having embedded strain-inducing pattern
Grant 9,240,481 - Maeda , et al. January 19, 2 | 2016-01-19 |
Semiconductor device, method of manufacturing the same, and method of evaluating semiconductor device
Grant 9,093,529 - Fukutome , et al. July 28, 2 | 2015-07-28 |
Semiconductor Device, Method Of Manufacturing The Same, And Method Of Evaluating Semiconductor Device
App 20150194527 - Fukutome; Hidenobu ; et al. | 2015-07-09 |
Semiconductor Device Having Embedded Strain-inducing Pattern
App 20150123176 - Maeda; Shigenobu ; et al. | 2015-05-07 |
Method of forming semiconductor device having embedded strain-inducing pattern
Grant 8,962,435 - Maeda , et al. February 24, 2 | 2015-02-24 |
Method Of Forming Semiconductor Device Having Embedded Strain-inducing Pattern
App 20150024565 - Maeda; Shigenobu ; et al. | 2015-01-22 |
Semiconductor device having embedded strain-inducing pattern and method of forming the same
Grant 8,884,298 - Maeda , et al. November 11, 2 | 2014-11-11 |
Semiconductor Device and Fabricating Method Thereof
App 20140203370 - Maeda; Shigenobu ; et al. | 2014-07-24 |
Semiconductor Device Having Embedded Strain-inducing Pattern And Method Of Forming The Same
App 20130341631 - Maeda; Shigenobu ; et al. | 2013-12-26 |
Semiconductor Device And Method Of Fabricating The Same
App 20130343121 - Fukutome; Hidenobu | 2013-12-26 |
Manufacturing method of semiconductor device with amorphous silicon layer formation
Grant 8,546,247 - Fukutome , et al. October 1, 2 | 2013-10-01 |
Semiconductor device having nickel silicide layer
Grant 8,399,345 - Fukutome March 19, 2 | 2013-03-19 |
Semiconductor device including MISFET and its manufacture method
Grant 8,362,530 - Fukutome January 29, 2 | 2013-01-29 |
Semiconductor device, method of manufacturing the same, and method of evaluating semiconductor device
Grant 7,989,299 - Fukutome , et al. August 2, 2 | 2011-08-02 |
Method for fabricating semiconductor device with fully silicided gate electrode
Grant 7,977,194 - Fukutome , et al. July 12, 2 | 2011-07-12 |
Semiconductor Device Having Nickel Silicide Layer
App 20110089497 - Fukutome; Hidenobu | 2011-04-21 |
Semiconductor Device Including Misfet And Its Manufacture Method
App 20110089474 - Fukutome; Hidenobu | 2011-04-21 |
Semiconductor device and process for manufacturing the same
Grant 7,898,036 - Fukutome March 1, 2 | 2011-03-01 |
Semiconductor Device, Method Of Manufacturing The Same, And Method Of Evaluating Semiconductor Device
App 20100311218 - Fukutome; Hidenobu ; et al. | 2010-12-09 |
Semiconductor Device And Method Of Manufacturing The Semiconductor Device
App 20100078729 - Fukutome; Hidenobu ; et al. | 2010-04-01 |
Method of suppressing diffusion in a semiconductor device
Grant 7,592,243 - Momiyama , et al. September 22, 2 | 2009-09-22 |
Manufacturing Method Of Semiconductor Device
App 20090227085 - FUKUTOME; Hidenobu ; et al. | 2009-09-10 |
Semiconductor Device And Process For Manufacturing The Same
App 20080277733 - Fukutome; Hidenobu | 2008-11-13 |
Semiconductor device, method of manufacturing the same, and method of evaluating semiconductor device
App 20080142839 - Fukutome; Hidenobu ; et al. | 2008-06-19 |
Manufacturing Method Of Semiconductor Device
App 20080009111 - FUKUTOME; Hidenobu ; et al. | 2008-01-10 |
Method for fabricating semiconductor device and method for designing semiconductor device
App 20070026595 - Fukutome; Hidenobu ; et al. | 2007-02-01 |
Method of fabricating semiconductor a device
App 20060046372 - Momiyama; Youichi ; et al. | 2006-03-02 |
Semiconductor device, method of manufacturing the same, and method of evaluating semiconductor device
App 20050285203 - Fukutome, Hidenobu ; et al. | 2005-12-29 |
Semiconductor device and method of fabricating the same
Grant 6,977,417 - Momiyama , et al. December 20, 2 | 2005-12-20 |
Semiconductor device and method of fabricating the same
App 20040004250 - Momiyama, Youichi ; et al. | 2004-01-08 |
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