| Patent | Date |
|---|
Monitoring System, Battery-type Power Supply Device, Monitoring Server Apparatus And Monitoring Program
App 20210226289 - FUKUSHIMA; Toshitaka | 2021-07-22 |
Battery-type power supply device and battery-driven load device
Grant 10,763,555 - Fukushima , et al. Sep | 2020-09-01 |
Battery-type Power Supply Device And Battery-driven Load Device
App 20190280348 - FUKUSHIMA; Toshitaka ; et al. | 2019-09-12 |
Electronic timepiece
Grant 9,092,015 - Kato , et al. July 28, 2 | 2015-07-28 |
Electronic timepiece
Grant 9,036,455 - Kato , et al. May 19, 2 | 2015-05-19 |
Power supply unit and electronic timepiece
Grant 8,982,675 - Kato , et al. March 17, 2 | 2015-03-17 |
Electronic Timepiece
App 20130194897 - KATO; Kazuo ; et al. | 2013-08-01 |
Electronic Timepiece
App 20130194898 - KATO; Kazuo ; et al. | 2013-08-01 |
Electronic Timepiece
App 20130194896 - KATO; Kazuo ; et al. | 2013-08-01 |
Electronic Apparatus
App 20130003508 - KATO; Kazuo ; et al. | 2013-01-03 |
Power supply unit and electronic timepiece
App 20120057437 - Kato; Kazuo ; et al. | 2012-03-08 |
Semiconductor programmable memory device
Grant 4,922,319 - Fukushima May 1, 1 | 1990-05-01 |
Semiconductor wafer-scale integrated device composed of interconnected multiple chips each having an integration circuit chip formed thereon
Grant 4,907,062 - Fukushima March 6, 1 | 1990-03-06 |
Method of forming groove isolation filled with dielectric for semiconductor device
Grant 4,866,004 - Fukushima September 12, 1 | 1989-09-12 |
Data collection system having stationary unit with electromagnetic induction circuitry for bidirectionally relaying data
Grant 4,839,854 - Sakami , et al. June 13, 1 | 1989-06-13 |
Semiconductor device having a transistor with increased current amplification factor
Grant 4,654,688 - Fukushima March 31, 1 | 1987-03-31 |
Electronic sphygmomanometer
Grant 4,607,641 - Fukushima August 26, 1 | 1986-08-26 |
Semiconductor device with deep oxide isolation
Grant 4,466,012 - Fukushima August 14, 1 | 1984-08-14 |
Field programmable device with circuitry for detecting poor insulation between adjacent word lines
Grant 4,459,694 - Ueno , et al. July 10, 1 | 1984-07-10 |
Field programmable device with internal dynamic test circuit
Grant 4,429,388 - Fukushima , et al. January 31, 1 | 1984-01-31 |
Programmable read-only memory device
Grant 4,347,584 - Fukushima , et al. August 31, 1 | 1982-08-31 |
Three-state output circuit
Grant 4,322,640 - Fukushima , et al. March 30, 1 | 1982-03-30 |
Integrated circuit with double dielectric isolation walls
Grant 4,320,411 - Fukushima March 16, 1 | 1982-03-16 |
Field programmable device having test provisions for fault detection
Grant 4,320,507 - Fukushima , et al. March 16, 1 | 1982-03-16 |
Surge arrester assembly
Grant 4,319,300 - Napiorkowski , et al. March 9, 1 | 1982-03-09 |
Programming circuit for permanently storing data in a programmable read only memory
Grant 4,319,341 - Fukushima , et al. March 9, 1 | 1982-03-09 |
Semiconductor memory device
Grant 4,287,569 - Fukushima September 1, 1 | 1981-09-01 |
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