Fukushima; Tetsuyuki
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fukushima; Tetsuyuki.The latest application filed is for "semiconductor device".
- Fukushima; Tetsuyuki - Hyogo JP
- Fukushima; Tetsuyuki - Nishinomiya JP
- Fukushima, Tetsuyuki - Nishinomiya-shi JP
| Patent | Date |
|---|---|
| Semiconductor device Grant 10,741,545 - Tamaru , et al. A | 2020-08-11 |
| Semiconductor Device App 20200035669 - TAMARU; Masaki ; et al. | 2020-01-30 |
| Semiconductor device Grant 10,312,339 - Kaneko , et al. | 2019-06-04 |
| Semiconductor Device App 20180040706 - KANEKO; Saichirou ; et al. | 2018-02-08 |
| Semiconductor device Grant 9,818,835 - Kaneko , et al. November 14, 2 | 2017-11-14 |
| Semiconductor Device App 20160351676 - KANEKO; Saichirou ; et al. | 2016-12-01 |
| Semiconductor Device App 20160035853 - KANEKO; SAICHIROU ; et al. | 2016-02-04 |
| Converter and semiconductor device Grant 9,246,402 - Sakurai , et al. January 26, 2 | 2016-01-26 |
| Converter And Semiconductor Device App 20140036561 - SAKURAI; Tatsuya ; et al. | 2014-02-06 |
| Switching power supply device with a switching control circuit Grant 8,427,850 - Morota , et al. April 23, 2 | 2013-04-23 |
| Switching Power Supply Device App 20110194314 - MOROTA; Naohiko ; et al. | 2011-08-11 |
| Nonvolatile memory microcomputer chip, and a method for testing the nonvolatile memory microcomputer chip Grant 7,035,751 - Shinagawa , et al. April 25, 2 | 2006-04-25 |
| Nonvolatile memory microcomputer chip, and a method for testing the nonvolatile memory microcomputer chip App 20040153924 - Shinagawa, Masatoshi ; et al. | 2004-08-05 |
| Apparatus and method for extending data retention time of semiconductor storage circuit Grant 5,654,913 - Fukushima , et al. August 5, 1 | 1997-08-05 |
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