Fukushima; Hideki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fukushima; Hideki.The latest application filed is for "defect inspection apparatus and pattern chip".

Company Profile

5.18.17

Fukushima; Hideki - Tokyo JP
Fukushima; Hideki - Okazaki JP
Fukushima; Hideki - Okazaki-shi JP
Fukushima; Hideki - Hitachinaka JP
Fukushima; Hideki - Okayama N/A JP
Fukushima; Hideki - Higashichichibu JP
FUKUSHIMA; Hideki - Gifu-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Defect inspection apparatus and pattern chip Grant 10,955,361 - Urano , et al. March 23, 2	2021-03-23
Defect inspection device, pattern chip, and defect inspection method Grant 10,948,424 - Urano , et al. March 16, 2	2021-03-16
Defect Inspection Apparatus And Pattern Chip App 20200182804 - URANO; Yuta ; et al.	2020-06-11
Exhaust pipe structure Grant 10,641,156 - Koda , et al.	2020-05-05
Exhaust mechanism for vehicle Grant 10,605,146 - Oya , et al.	2020-03-31
Defect Inspection Device, Pattern Chip, And Defect Inspection Method App 20190107498 - URANO; Yuta ; et al.	2019-04-11
Exhaust Mechanism For Vehicle App 20180179943 - Oya; Takeshi ; et al.	2018-06-28
Exhaust Pipe Structure App 20180119594 - KODA; Yasuhiko ; et al.	2018-05-03
Defect inspection method and device using same Grant 9,606,071 - Shibata , et al. March 28, 2	2017-03-28
Defect Inspection Method And Device Using Same App 20160305893 - SHIBATA; Yukihiro ; et al.	2016-10-20
Defect inspection method and device using same Grant 9,329,137 - Shibata , et al. May 3, 2	2016-05-03
Defect Inspection Method And Device Using Same App 20160011123 - SHIBATA; Yukihiro ; et al.	2016-01-14
Contamination inspection method and contamination inspection device Grant 9,176,075 - Gunji , et al. November 3, 2	2015-11-03
Method for inhibiting the deterioration of eating-quality characteristics of foods containing gelatinized starch Grant 8,834,950 - Fukushima , et al. September 16, 2	2014-09-16
Defect inspecting apparatus and defect inspecting method Grant 8,564,767 - Fukushima , et al. October 22, 2	2013-10-22
Defect Inspecting Apparatus And Defect Inspecting Method App 20130208270 - Fukushima; Hideki ; et al.	2013-08-15
Foreign matter inspection method and foreign matter inspection apparatus Grant 8,422,009 - Yamashita , et al. April 16, 2	2013-04-16
Method of processing orifice Grant 8,402,655 - Higuma , et al. March 26, 2	2013-03-26
Contamination Inspection Method And Contamination Inspection Device App 20120147364 - Gunji; Masanori ; et al.	2012-06-14
Foreign Matter Inspection Method And Foreign Matter Inspection Apparatus App 20110267605 - Yamashita; Hiroyuki ; et al.	2011-11-03
Foreign matter inspection method and foreign matter inspection apparatus Grant 7,986,405 - Yamashita , et al. July 26, 2	2011-07-26
Method of Processing Orifice App 20100229385 - HIGUMA; Masato ; et al.	2010-09-16
Foreign Matter Inspection Method And Foreign Matter Inspection Apparatus App 20100195095 - YAMASHITA; Hiroyuki ; et al.	2010-08-05
Foreign matter inspection method and foreign matter inspection apparatus Grant 7,719,671 - Yamashita , et al. May 18, 2	2010-05-18
Method For Inhibiting The Deterioration Of Eating-quality Characteristics Of Foods Containing Gelatinized Starch App 20090186140 - Fukushima; Hideki ; et al.	2009-07-23
Inspecting Device And Inspecting Method App 20080297786 - Fukushima; Hideki ; et al.	2008-12-04
Agent For Reduction Of Oxidized Albumin Level App 20080161399 - MORIWAKI; Hisataka ; et al.	2008-07-03
Foreign matter inspection method and foreign matter inspection apparatus App 20070201019 - Yamashita; Hiroyuki ; et al.	2007-08-30
Method and apparatus for detecting defects App 20050264797 - Nakano, Hiroyuki ; et al.	2005-12-01

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