FUKUSHI; Jukiya
Patent Applications and Registrations
Patent applications and USPTO patent grants for FUKUSHI; Jukiya.The latest application filed is for "measurement system and measurement method".
- FUKUSHI; Jukiya - Aomori JP
| Patent | Date |
|---|---|
| Measurement System And Measurement Method App 20220034714 - OKUTA; Michitaka ; et al. | 2022-02-03 |
| Optical Probe, Optical Probe Array, Optical Probe Card, And Method Of Manufacturing Optical Probe App 20210364552 - OKUTA; Michitaka ; et al. | 2021-11-25 |
| Measurement System App 20210148835 - OKUTA; Michitaka ; et al. | 2021-05-20 |
| Optical Probe, Optical Probe Array, Test System And Test Method App 20210102864 - OKUTA; Michitaka ; et al. | 2021-04-08 |
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