Fukaya; Ritsuo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fukaya; Ritsuo.The latest application filed is for "scanning electron microscope".

Company Profile

0.22.19

Fukaya; Ritsuo - Tokyo JP
Fukaya; Ritsuo - Hitachinaka N/A JP
FUKAYA; Ritsuo - Hitachinaka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanning electron microscope Grant 8,969,801 - Okai , et al. March 3, 2	2015-03-03
Charged particle beam device Grant 8,907,267 - Wang , et al. December 9, 2	2014-12-09
Scanning Electron Microscope App 20140299769 - Okai; Nobuhiro ; et al.	2014-10-09
Sample electrification measurement method and charged particle beam apparatus Grant 8,835,844 - Ezumi , et al. September 16, 2	2014-09-16
Charged Particle Beam Device App 20140217274 - Wang; Zhigang ; et al.	2014-08-07
Scanning electron microscope optical condition setting method and scanning electron microscope Grant 8,692,197 - Wang , et al. April 8, 2	2014-04-08
Method for controlling charging of sample and scanning electron microscope Grant 8,487,251 - Fukaya , et al. July 16, 2	2013-07-16
Scanning Electron Microscope Optical Condition Setting Method and Scanning Electron Microscope App 20120318977 - Wang; Zhigang ; et al.	2012-12-20
Charged-Particle-Beam Device App 20120126119 - Fukaya; Ritsuo ; et al.	2012-05-24
Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope Grant 8,178,836 - Ishijima , et al. May 15, 2	2012-05-15
Sample dimension measuring method and scanning electron microscope Grant 8,080,789 - Nasu , et al. December 20, 2	2011-12-20
Method For Controlling Charging Of Sample And Scanning Electron Microscope App 20110139981 - Fukaya; Ritsuo ; et al.	2011-06-16
Charged Particle Beam Irradiation System App 20110073760 - FUKAYA; Ritsuo ; et al.	2011-03-31
Charged particle beam irradiation system Grant 7,851,756 - Fukaya , et al. December 14, 2	2010-12-14
Sample Electrification Measurement Method and Charged Particle Beam Apparatus App 20100294929 - Ezumi; Makoto ; et al.	2010-11-25
Electrostatic Charge Measurement Method, Focus Adjustment Method, and Scanning Electron Microscope App 20100237241 - ISHIJIMA; Tatsuaki ; et al.	2010-09-23
Electrostatic charge measurement method, focus adjustment method, and scanning electron microscope Grant 7,745,782 - Ishijima , et al. June 29, 2	2010-06-29
Sample electrification measurement method and charged particle beam apparatus Grant 7,700,918 - Ezumi , et al. April 20, 2	2010-04-20
Sample dimension measuring method and scanning electron microscope App 20100038535 - Nasu; Osamu ; et al.	2010-02-18
Method for measuring dimensions of sample and scanning electron microscope Grant 7,659,508 - Nasu , et al. February 9, 2	2010-02-09
Scanning electron microscope Grant 7,566,872 - Fukaya , et al. July 28, 2	2009-07-28
Charged Particle Beam Irradiation System App 20090032723 - FUKAYA; Ritsuo ; et al.	2009-02-05
Electrostatic Charge Measurement Method, Focus Adjustment Method, And Scanning Electron Microscope App 20080203298 - ISHIJIMA; Tatsuaki ; et al.	2008-08-28
Sample electrification measurement method and charged particle beam apparatus App 20080201091 - Ezumi; Makoto ; et al.	2008-08-21
Sample electrification measurement method and charged particle beam apparatus Grant 7,372,028 - Ezumi , et al. May 13, 2	2008-05-13
Scanning electron microscope App 20070045539 - Fukaya; Ritsuo ; et al.	2007-03-01
Sample electrification measurement method and charged particle beam apparatus App 20060219918 - Ezumi; Makoto ; et al.	2006-10-05
Sample electrification measurement method and charged particle beam apparatus Grant 7,087,899 - Ezumi , et al. August 8, 2	2006-08-08
Sample electrification measurement method and charged particle beam apparatus Grant 6,946,656 - Ezumi , et al. September 20, 2	2005-09-20
Sample electrification measurement method and charged particle beam apparatus App 20050161600 - Ezumi, Makoto ; et al.	2005-07-28
Sample electrification measurement method and charged particle beam apparatus App 20040211899 - Ezumi, Makoto ; et al.	2004-10-28
Method for measuring dimensions of sample and scanning electron microscope App 20040051040 - Nasu, Osamu ; et al.	2004-03-18
Liquid crystal display device utilizing in-plane-switching system and having alignment film separating picture element electrode or counter electrode from liquid crystal layer Grant 6,300,995 - Wakagi , et al. October 9, 2	2001-10-09
Active matrix addressed liquid crystal display device App 20010011981 - Yamamoto, Tsunenori ; et al.	2001-08-09
Active matrix liquid crystal display Grant 6,184,946 - Ando , et al. February 6, 2	2001-02-06
Liquid crystal display device in-plane-switching system with counter electrode in contact with liquid crystal Grant 5,995,187 - Wakagi , et al. November 30, 1	1999-11-30

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