Fukaya; Futoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fukaya; Futoshi.The latest application filed is for "semiconductor package, method for manufacturing a semiconductor package, an electronic device, method for manufacturing an electronic device".

Company Profile

0.11.8

Fukaya; Futoshi - Kawasaki JP
Fukaya, Futoshi - Kawasaki-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Mold for resin molding, resin molding apparatus, and semiconductor device manufacture method Grant 7,682,140 - Fukaya , et al. March 23, 2	2010-03-23
Semiconductor package, method for manufacturing a semiconductor package, an electronic device, method for manufacturing an electronic device Grant 7,646,089 - Fukaya , et al. January 12, 2	2010-01-12
Semiconductor Package, Method For Manufacturing A Semiconductor Package, An Electronic Device, Method For Manufacturing An Electronic Device App 20090283897 - FUKAYA; Futoshi ; et al.	2009-11-19
Mold for resin molding, resin molding apparatus, and semiconductor device manufacture method App 20070231956 - Fukaya; Futoshi ; et al.	2007-10-04
Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor Grant 7,174,629 - Maruyama , et al. February 13, 2	2007-02-13
Semiconductor testing device App 20050162180 - Maruyama, Shigeyuki ; et al.	2005-07-28
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor Grant 6,781,395 - Maruyama , et al. August 24, 2	2004-08-24
Semiconductor testing device App 20040124866 - Maruyama, Shigeyuki ; et al.	2004-07-01
Semiconductor testing device Grant 6,661,247 - Maruyama , et al. December 9, 2	2003-12-09
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor App 20030197501 - Maruyama, Shigeyuki ; et al.	2003-10-23
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor Grant 6,603,325 - Maruyama , et al. August 5, 2	2003-08-05
Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor App 20030132027 - Maruyama, Shigeyuki ; et al.	2003-07-17
IC socket, a test method using the same and an IC socket mounting mechanism Grant 6,535,002 - Haseyama , et al. March 18, 2	2003-03-18
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor App 20020190741 - Maruyama, Shigeyuki ; et al.	2002-12-19
Contactor for semiconductor devices, a testing apparatus using such contactor, a testing method using such contactor, and a method of cleaning such contactor Grant 6,466,046 - Maruyama , et al. October 15, 2	2002-10-15
IC socket, a test method using the same and an IC socket mounting mechanism App 20010011898 - Haseyama, Makoto ; et al.	2001-08-09
Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage Grant 6,249,135 - Maruyama , et al. June 19, 2	2001-06-19
Test board and a test method using the same providing improved electrical connection Grant 6,046,598 - Miyaji , et al. April 4, 2	2000-04-04
Semiconductor device testing carrier and method of fixing semiconductor device to testing carrier Grant 5,986,459 - Fukaya , et al. November 16, 1	1999-11-16

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