Fukasawa; Shinji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fukasawa; Shinji.The latest application filed is for "method for eliminating hold error in scan chain".

Company Profile

0.4.7

Fukasawa; Shinji - Kasugai JP
Fukasawa, Shinji - Kasugai-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for eliminating hold error in scan chain Grant 7,480,844 - Sakuma , et al. January 20, 2	2009-01-20
Layout method for semiconductor integrated circuit, layout program for semiconductor integrated circuit and layout system for semiconductor integrated circuit Grant 7,437,699 - Morita , et al. October 14, 2	2008-10-14
Method and apparatus for laying out cells in a semiconductor device Grant 7,185,303 - Fukasawa February 27, 2	2007-02-27
Method for eliminating hold error in scan chain App 20060236177 - Sakuma; Shouji ; et al.	2006-10-19
Method and apparatus for laying out cells in a semiconductor device App 20060225016 - Fukasawa; Shinji	2006-10-05
Layout method for semiconductor integrated circuit, layout program for semiconductor integrated circuit and layout system for semiconductor integrated circuit App 20060064663 - Morita; Hirotaka ; et al.	2006-03-23
Semiconductor device and layout data generation apparatus Grant 6,941,534 - Fukasawa September 6, 2	2005-09-06
Semiconductor device having a multiple layer wiring structure, wiring method, wiring device, and recording medium App 20030067075 - Fukasawa, Shinji	2003-04-10
Semiconductor device having a multiple layer wiring structure, wiring method, wiring device, and recording medium App 20030015800 - Fukasawa, Shinji	2003-01-23
Semiconductor device having a multiple layer wiring structure, wiring method, wiring device, and recording medium App 20020074660 - Fukasawa, Shinji	2002-06-20
Semiconductor device and layout data generation apparatus App 20020074571 - Fukasawa, Shinji	2002-06-20

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