Fukano; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fukano; Takashi.The latest application filed is for "illumination apparatus for microscope and image processing apparatus using the same".

Company Profile

0.6.5

Fukano; Takashi - Tokyo JP
Fukano; Takashi - Wako JP
Fukano; Takashi - Tokyo-to JP
Fukano, Takashi - Nerima-ku JP
Fukano, Takashi - Wako-Shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Illumination apparatus for microscope Grant 7,315,413 - Miyawaki , et al. January 1, 2	2008-01-01
Microscope system Grant 7,277,566 - Miyawaki , et al. October 2, 2	2007-10-02
Illumination apparatus for microscope and image processing apparatus using the same Grant 7,236,298 - Miyawaki , et al. June 26, 2	2007-06-26
Illumination apparatus for microscope and image processing apparatus using the same App 20070008615 - Miyawaki; Atsushi ; et al.	2007-01-11
Illumination apparatus for microscope and image processing apparatus using the same Grant 7,126,752 - Miyawaki , et al. October 24, 2	2006-10-24
Illumination apparatus for microscope App 20060098418 - Miyawaki; Atsushi ; et al.	2006-05-11
Illumination system for microscopy and observation or measuring method using the same Grant 6,903,869 - Fukano , et al. June 7, 2	2005-06-07
Illumination apparatus for microscope and image processing apparatus using the same App 20040120034 - Miyawaki, Atsushi ; et al.	2004-06-24
Microscope system App 20040061914 - Miyawaki, Atsushi ; et al.	2004-04-01
Illumination system for microscopy and observation or measuring method using the same App 20030161039 - Fukano, Takashi ; et al.	2003-08-28
Method of measuring thickness and refractive indices of component layers of laminated structure and measuring apparatus for carrying out the same Grant 5,943,134 - Yamaguchi , et al. August 24, 1	1999-08-24

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