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name:-0.0071430206298828
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Fujiyama; Hitoshi Patent Filings

Fujiyama; Hitoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fujiyama; Hitoshi.The latest application filed is for "anisotropic conductive connector, probe member and wafer inspection system".

Company Profile
0.5.4
  • Fujiyama; Hitoshi - Minato-ku JP
  • Fujiyama; Hitoshi - Chuo-ku JP
  • Fujiyama; Hitoshi - Tokyo JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Anisotropic conductive connector, probe member and wafer inspection system
Grant 8,410,808 - Naoi , et al. April 2, 2
2013-04-02
Sheet-like probe, method of producing the probe, and application of the probe
Grant 7,737,707 - Sato , et al. June 15, 2
2010-06-15
Anisotropic Conductive Connector, Probe Member And Wafer Inspection System
App 20100127724 - Naoi; Masaya ;   et al.
2010-05-27
Sheet-like probe, method of producing the probe, and application of the probe
Grant 7,671,609 - Sato , et al. March 2, 2
2010-03-02
Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment
Grant 7,656,176 - Yoshioka , et al. February 2, 2
2010-02-02
Probe Member For Wafer Inspection, Probe Card For Wafer Inspection And Wafer Inspection Equipment
App 20090140756 - Yoshioka; Mutsuhiko ;   et al.
2009-06-04
Probe Member for Wafer Inspection, Probe Card for Wafer Inspection and Wafer Inspection Apparatus
App 20070268032 - Yoshioka; Mutsuhiko ;   et al.
2007-11-22
Sheet-Like Probe, Method Of Producing The Probe, And Application Of The Probe
App 20070205783 - Sato; Katsumi ;   et al.
2007-09-06

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