FUJIWARA; Nariaki
Patent Applications and Registrations
Patent applications and USPTO patent grants for FUJIWARA; Nariaki.The latest application filed is for "image acquisition apparatus, pattern inspection apparatus, and image acquisition method".
- FUJIWARA; Nariaki - Kyoto JP
- Fujiwara; Nariaki - Kamikyo JP
| Patent | Date |
|---|---|
| Image Acquisition Apparatus, Pattern Inspection Apparatus, And Image Acquisition Method App 20120307041 - FUJIWARA; Nariaki ; et al. | 2012-12-06 |
| Measuring apparatus Grant 7,012,702 - Fujiwara , et al. March 14, 2 | 2006-03-14 |
| Film detection apparatus for detecting organic film formed on printed circuit board, inspection system, and method of inspecting printed circuit board App 20060023936 - Fujiwara; Nariaki | 2006-02-02 |
| Measuring apparatus App 20030133133 - Fujiwara, Nariaki ; et al. | 2003-07-17 |
| Grinding process monitoring system and grinding process monitoring method Grant 6,000,996 - Fujiwara December 14, 1 | 1999-12-14 |
| Method of measuring film thicknesses Grant 5,493,401 - Horie , et al. February 20, 1 | 1996-02-20 |
| Displacement detection system Grant 5,251,011 - Fujiwara , et al. October 5, 1 | 1993-10-05 |
| Method of focusing optical head on object body and automatic focusing device for optical inspection system including tilt detection Grant 5,136,149 - Fujiwara , et al. August 4, 1 | 1992-08-04 |
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