Fujisaki; Kenichi
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fujisaki; Kenichi.The latest application filed is for "heat storage laminate".
- Fujisaki; Kenichi - Saitama JP
- Fujisaki; Kenichi - Tokyo JP
- Fujisaki; Kenichi - Gyoda JP
| Patent | Date |
|---|---|
| Heat storage sheet Grant 11,340,026 - Fujisaki , et al. May 24, 2 | 2022-05-24 |
| Heat-storage composition Grant 10,968,379 - Koseki , et al. April 6, 2 | 2021-04-06 |
| Heat storage molded body, heat storage laminate, and heat storage molded body production method Grant 10,619,942 - Fujisaki , et al. | 2020-04-14 |
| Heat storage molded body, heat storage laminate, and heat storage molded body production method Grant 10,502,499 - Fujisaki , et al. Dec | 2019-12-10 |
| Heat-storage Composition App 20190106612 - Koseki; Yuko ; et al. | 2019-04-11 |
| Heat Storage Sheet App 20190107334 - Fujisaki; Kenichi ; et al. | 2019-04-11 |
| Heat Storage Laminate App 20190107335 - Fujisaki; Kenichi ; et al. | 2019-04-11 |
| Heat Storage Molded Body, Heat Storage Laminate, And Heat Storage Molded Body Production Method App 20180094872 - Fujisaki; Kenichi ; et al. | 2018-04-05 |
| Heat Storage Molded Body, Heat Storage Laminate, And Heat Storage Molded Body Production Method App 20180094873 - Fujisaki; Kenichi ; et al. | 2018-04-05 |
| Test apparatus Grant 8,677,197 - Fujisaki March 18, 2 | 2014-03-18 |
| Test apparatus and repair analysis method Grant 8,325,547 - Fujisaki December 4, 2 | 2012-12-04 |
| Clear instruction information to indicate whether memory test failure information is valid Grant 8,261,139 - Fujisaki September 4, 2 | 2012-09-04 |
| Test Apparatus App 20120216086 - FUJISAKI; Kenichi | 2012-08-23 |
| Test Apparatus And Repair Analysis Method App 20120120748 - FUJISAKI; Kenichi | 2012-05-17 |
| Test Apparatus App 20120117432 - FUJISAKI; Kenichi | 2012-05-10 |
| Test Apparatus And Test Method App 20100235694 - FUJISAKI; Kenichi | 2010-09-16 |
| Test apparatus having a pattern memory and test method for testing a device under test Grant 7,636,877 - Fujisaki December 22, 2 | 2009-12-22 |
| Testing apparatus and testing method Grant 7,529,989 - Fujisaki May 5, 2 | 2009-05-05 |
| Memory tester having defect analysis memory with two storage sections Grant 7,337,381 - Fujisaki February 26, 2 | 2008-02-26 |
| Test Apparatus And Test Method App 20070271045 - FUJISAKI; KENICHI | 2007-11-22 |
| Testing apparatus and testing method App 20070208969 - Fujisaki; Kenichi | 2007-09-06 |
| Test apparatus App 20060026482 - Fujisaki; Kenichi | 2006-02-02 |
| Memory testing apparatus Grant 6,173,238 - Fujisaki January 9, 2 | 2001-01-09 |
| Semiconductor memory testing apparatus Grant 6,115,833 - Sato , et al. September 5, 2 | 2000-09-05 |
| Test pattern generator for memories having a block write function Grant 6,032,281 - Fujisaki February 29, 2 | 2000-02-29 |
| High speed pattern generating method and high speed pattern generator using the method Grant 6,006,349 - Fujisaki December 21, 1 | 1999-12-21 |
| Test pattern generator Grant 5,856,985 - Fujisaki January 5, 1 | 1999-01-05 |
| Memory testing apparatus Grant 5,831,989 - Fujisaki November 3, 1 | 1998-11-03 |
| Memory testing device Grant 4,958,345 - Fujisaki September 18, 1 | 1990-09-18 |
| Memory testing device Grant 4,958,346 - Fujisaki September 18, 1 | 1990-09-18 |
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