Fujino; Naohiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fujino; Naohiko.The latest application filed is for "method of and device for cleaning silicon wafer, cleaned silicon wafer, and cleaned semiconductor element".

Company Profile

0.8.2

Fujino; Naohiko - Hyogo JP
FUJINO, NAOHIKO - TOKYO JP
Fujino; Naohiko - Amagasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for analyzing minute foreign substance, and process for semiconductor elements or liquid crystal elements by use thereof Grant 6,355,495 - Fujino , et al. March 12, 2	2002-03-12
Method Of And Device For Cleaning Silicon Wafer, Cleaned Silicon Wafer, And Cleaned Semiconductor Element App 20020026952 - FUJINO, NAOHIKO ; et al.	2002-03-07
Surface analyzing apparatus App 20010048076 - Wakiyama, Shigeru ; et al.	2001-12-06
Surface analyzing apparatus Grant 6,259,093 - Wakiyama , et al. July 10, 2	2001-07-10
Thin film forming apparatus using laser Grant 6,110,291 - Haruta , et al. August 29, 2	2000-08-29
Particle detecting method and system for detecting minute particles on a workpiece Grant 5,907,398 - Fujino , et al. May 25, 1	1999-05-25
Analyzing method and apparatus for minute foreign substances, and manufacturing methods for manufacturing semiconductor device and liquid crystal display device using the same Grant 5,877,035 - Fujino , et al. March 2, 1	1999-03-02
Method of detecting the position and the content of fine foreign matter on substrates and analyzers used therefor Grant 5,715,052 - Fujino , et al. February 3, 1	1998-02-03
Optical scanning system utilizing an atomic force microscope and an optical microscope Grant 5,650,614 - Yasutake , et al. July 22, 1	1997-07-22
Semiconductor cleaning apparatus and wafer cassette Grant 5,445,171 - Ohmori , et al. August 29, 1	1995-08-29

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