Fujii; Tatuhisa
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fujii; Tatuhisa.The latest application filed is for "inspection apparatus and inspection method".
- Fujii; Tatuhisa - Fukuyama JP
- Fujii, Tatuhisa - Fukuyama-shi JP
| Patent | Date |
|---|---|
| Inspection apparatus for conductive patterns of a circuit board, and a holder thereof Grant 6,861,863 - Ishioka , et al. March 1, 2 | 2005-03-01 |
| Apparatus and method for inspecting a board used in a liquid crystal panel Grant 6,859,062 - Fujii , et al. February 22, 2 | 2005-02-22 |
| Inspection apparatus and sensor Grant 6,734,692 - Fujii , et al. May 11, 2 | 2004-05-11 |
| Method and apparatus for inspection Grant 6,710,607 - Fujii , et al. March 23, 2 | 2004-03-23 |
| Inspection apparatus and inspection method App 20030117164 - Fujii, Tatuhisa ; et al. | 2003-06-26 |
| Tester and holder for tester App 20020140445 - Ishioka, Shogo ; et al. | 2002-10-03 |
| Inspection apparatus and sensor App 20020140448 - Fujii, Tatuhisa ; et al. | 2002-10-03 |
| Method and apparatus for inspection App 20020135390 - Fujii, Tatuhisa ; et al. | 2002-09-26 |
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