FU; Wei-En

Patent Applications and Registrations

Patent applications and USPTO patent grants for FU; Wei-En.The latest application filed is for "x-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate".

Company Profile

1.8.11

FU; Wei-En - Taoyuan City TW
Fu; Wei-En - Taoyuan TW
Fu; Wei-En - Chutung TW
Fu; Wei-En - Hsinchu TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
X-ray Reflectometry Apparatus And Method Thereof For Measuring Three Dimensional Nanostructures On Flat Substrate App 20220120561 - LIU; Chun-Ting ; et al.	2022-04-21
Device and method applicable for measuring ultrathin thickness of film on substrate Grant 11,287,253 - Liu , et al. March 29, 2	2022-03-29
Device And Method Applicable For Measuring Ultrathin Thickness Of Film On Substrate App 20210199428 - LIU; Chun-Ting ; et al.	2021-07-01
X-ray Reflectometry Apparatus And Method Thereof For Measuring Three Dimensional Nanostructures On Flat Substrate App 20210109042 - LIU; Chun-Ting ; et al.	2021-04-15
Apparatus for mixing solution Grant 10,545,082 - Ho , et al. Ja	2020-01-28
Contactless dual-plane positioning method and device Grant 10,352,694 - Chen , et al. July 16, 2	2019-07-16
X-ray reflectometry apparatus for samples with a miniscule measurement area and a thickness in nanometers and method thereof Grant 10,151,713 - Wu , et al. Dec	2018-12-11
Contactless Dual-plane Positioning Method And Device App 20180299266 - CHEN; Guo-Dung ; et al.	2018-10-18
Analysis Apparatus App 20180128726 - Lin; Yen-Liang ; et al.	2018-05-10
Apparatus and method for aligning two plates during transmission small angle X-ray scattering measurements Grant 9,847,242 - Wu , et al. December 19, 2	2017-12-19
System and method for monitoring particles in solution Grant 9,625,365 - Ho , et al. April 18, 2	2017-04-18
Apparatus And Method For Mixing Solution App 20170065941 - Ho; Hsin-Chia ; et al.	2017-03-09
X-ray Reflectometry Apparatus For Samples With A Miniscule Measurement Area And A Thickness In Nanometers And Method Thereof App 20160341674 - WU; Wen-Li ; et al.	2016-11-24
Apparatus and method of applying small-angle electron scattering to characterize nanostructures on opaque substrate Grant 9,390,888 - Wu , et al. July 12, 2	2016-07-12
Apparatus And Method For Aligning Two Plates During Transmission Small Angle X-ray Scattering Measurements App 20160187267 - Wu; Wen-Li ; et al.	2016-06-30
Apparatus for amplifying intensity during transmission small angle--X-ray scattering measurements Grant 9,297,772 - Fu , et al. March 29, 2	2016-03-29
Apparatus And Method Of Applying Small-angle Electron Scattering To Characterize Nanostructures On Opaque Substrate App 20150340201 - Wu; Wen-Li ; et al.	2015-11-26
Apparatus And Method For Mixing Solution And System And Method For Monitoring Particles In Solution App 20150330886 - Ho; Hsin-Chia ; et al.	2015-11-19
Apparatus For Amplifying Intensity During Transmission Small Angle- X-ray Scattering Measurements App 20150036805 - FU; Wei-En ; et al.	2015-02-05

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