Fryars; Anthony
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fryars; Anthony.The latest application filed is for "re-using production test scan paths for system test of an integrated circuit".
- Fryars; Anthony - Allen TX
- Fryars; Anthony - Northampton GB
- Fryars; Anthony - Dustin Northampton GB
| Patent | Date |
|---|---|
| Re-using production test scan paths for system test of an integrated circuit App 20080235545 - Jayaram; Vinay Burjinroppa ; et al. | 2008-09-25 |
| Power reduction in module-based scan testing App 20060107144 - Saxena; Jayashree ; et al. | 2006-05-18 |
| LBIST controller circuits, systems, and methods with automated maximum scan channel length Grant 6,654,920 - Hetherington , et al. November 25, 2 | 2003-11-25 |
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