Frommhold; Dag

Patent Applications and Registrations

Patent applications and USPTO patent grants for Frommhold; Dag.The latest application filed is for "method for optically scanning and measuring an environment".

Company Profile

0.7.6

Frommhold; Dag - Neuffen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for optically scanning and measuring an environment Grant 9,835,727 - Ossig , et al. December 5, 2	2017-12-05
Method for optically scanning and measuring an environment Grant 9,835,726 - Ossig , et al. December 5, 2	2017-12-05
Method For Optically Scanning And Measuring An Environment App 20170276791 - Ossig; Martin ; et al.	2017-09-28
Method For Optically Scanning And Measuring An Environment App 20170227646 - Ossig; Martin ; et al.	2017-08-10
Method for optically scanning and measuring an environment Grant 9,684,078 - Ossig , et al. June 20, 2	2017-06-20
Method for optically scanning and measuring an environment Grant 9,678,211 - Ossig , et al. June 13, 2	2017-06-13
Method For Optically Scanning And Measuring An Environment App 20170139046 - Ossig; Martin ; et al.	2017-05-18
Method for optically scanning and measuring an environment Grant 9,645,240 - Ossig , et al. May 9, 2	2017-05-09
Method For Optically Scanning And Measuring An Environment App 20170123068 - Ossig; Martin ; et al.	2017-05-04
Method For Optically Scanning And Measuring An Environment App 20160238710 - Ossig; Martin ; et al.	2016-08-18
Method for optically scanning and measuring an environment Grant 9,329,271 - Ossig , et al. May 3, 2	2016-05-03
Method For Optically Scanning And Measuring An Environment App 20140022555 - Ossig; Martin ; et al.	2014-01-23

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