Fromm; David Patrick
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fromm; David Patrick.The latest application filed is for "time-tagged data for atomic force microscopy".
- Fromm; David Patrick - Palo Alto CA
- Fromm; David Patrick - Meno Park CA
| Patent | Date |
|---|---|
| Probe tip assembly for scanning probe microscopes Grant 8,136,389 - Tella , et al. March 20, 2 | 2012-03-20 |
| System for scanning probe microscope input device Grant 7,659,509 - Workman , et al. February 9, 2 | 2010-02-09 |
| Time-Tagged Data for Atomic Force Microscopy App 20090139313 - Fromm; David Patrick ; et al. | 2009-06-04 |
| Probe Tip Assembly For Scanning Probe Microscopes App 20090107266 - Tella; Richard Paul ; et al. | 2009-04-30 |
| Scanning Probe Microscope with Improved Scanning Speed App 20090107222 - Abramovitch; Daniel Yves ; et al. | 2009-04-30 |
| System For Scanning Probe Microscope Input Device App 20080142708 - Workman; Richard K. ; et al. | 2008-06-19 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 