loadpatents
Patent applications and USPTO patent grants for Frishman; Einat.The latest application filed is for "epitaxy metrology in fin field effect transistors".
Patent | Date |
---|---|
Epitaxy metrology in fin field effect transistors Grant 11,455,715 - Chaudhary , et al. September 27, 2 | 2022-09-27 |
Generating a metrology recipe usable for examination of a semiconductor specimen Grant 11,443,420 - Kris , et al. September 13, 2 | 2022-09-13 |
Epitaxy Metrology In Fin Field Effect Transistors App 20220261979 - CHAUDHARY; Jitendra Pradipkumar ;   et al. | 2022-08-18 |
Generating A Metrology Recipe Usable For Examination Of A Semiconductor Specimen App 20220207681 - KRIS; Roman ;   et al. | 2022-06-30 |
Evaluating a hole formed in an intermediate product Grant 11,056,404 - Kris , et al. July 6, 2 | 2021-07-06 |
Evaluating A Hole Formed In An Intermediate Product App 20210193536 - Kris; Roman ;   et al. | 2021-06-24 |
Coherently controlled laser distillation of chiral enantiomers Grant 6,402,898 - Brumer , et al. June 11, 2 | 2002-06-11 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.