Friedmann; Michael

Patent Applications and Registrations

Patent applications and USPTO patent grants for Friedmann; Michael.The latest application filed is for "methods and systems for compact, small spot size soft x-ray scatterometry".

Company Profile

9.36.48

Friedmann; Michael - Mountain View CA
Friedmann; Michael - Nesher IL
Friedmann; Michael - Bonn N/A DE
FRIEDMANN; Michael - Kitchener CA
Friedmann; Michael - Waterloo CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods And Systems For Compact, Small Spot Size Soft X-Ray Scatterometry App 20220196576 - Wang; David Y. ; et al.	2022-06-23
Methods and systems for semiconductor metrology based on polychromatic soft X-Ray diffraction Grant 11,333,621 - Wack , et al. May 17, 2	2022-05-17
Variable aperture mask Grant 11,268,901 - Blasenheim , et al. March 8, 2	2022-03-08
Laser produced plasma illuminator with liquid sheet jet target Grant 11,259,394 - Chang , et al. February 22, 2	2022-02-22
System and method for pumping laser sustained plasma with interlaced pulsed illumination sources Grant 11,121,521 - Bezel , et al. September 14, 2	2021-09-14
Laser Produced Plasma Illuminator With Liquid Sheet Jet Target App 20210136901 - Chang; Chao ; et al.	2021-05-06
Laser Produced Plasma Illuminator With Low Atomic Number Cryogenic Target App 20210136902 - Chang; Chao ; et al.	2021-05-06
X-ray zoom lens for small angle x-ray scatterometry Grant 10,859,518 - Artemiev , et al. December 8, 2	2020-12-08
Methods and systems for co-located metrology Grant 10,804,167 - Wang , et al. October 13, 2	2020-10-13
Collecting And Recycling Rare Gases In Semiconductor Processing Equipment App 20200294774 - Chang; Chao ; et al.	2020-09-17
System and Method for Pumping Laser Sustained Plasma with Interlaced Pulsed Illumination Sources App 20200274314 - Bezel; Ilya ; et al.	2020-08-27
Variable Aperture Mask App 20200271569 - Blasenheim; Barry ; et al.	2020-08-27
Methods And Systems For Co-Located Metrology App 20200243400 - Wang; David Y. ; et al.	2020-07-30
Variable aperture mask Grant 10,663,392 - Blasenheim , et al.	2020-05-26
Apparatus and methods for detecting overlay errors using scatterometry Grant 10,451,412 - Adel , et al. Oc	2019-10-22
Systems and methods for metrology beam stabilization Grant 10,365,211 - Blasenheim , et al. July 30, 2	2019-07-30
Systems And Methods For Metrology Beam Stabilization App 20190094130 - Blasenheim; Barry ; et al.	2019-03-28
Variable Aperture Mask App 20190049365 - Blasenheim; Barry ; et al.	2019-02-14
Methods And Systems For Semiconductor Metrology Based On Polychromatic Soft X-Ray Diffraction App 20190017946 - Wack; Daniel ; et al.	2019-01-17
Periodic patterns and technique to control misalignment between two layers Grant 10,151,584 - Abdulhalim , et al. Dec	2018-12-11
X-Ray Zoom Lens For Small Angle X-Ray Scatterometry App 20180188192 - Artemiev; Nikolay ; et al.	2018-07-05
Periodic Patterns And Technique To Control Misalignment Between Two Layers App 20180100735 - Abdulhalim; Ibrahim ; et al.	2018-04-12
Periodic patterns and technique to control misalignment between two layers Grant 9,835,447 - Abdulhalim , et al. December 5, 2	2017-12-05
Periodic Patterns And Technique To Control Misalignment Between Two Layers App 20170038198 - Abdulhalim; Ibrahim ; et al.	2017-02-09
Periodic patterns and technique to control misalignment between two layers Grant 9,476,698 - Abdulhalim , et al. October 25, 2	2016-10-25
Periodic Patterns and Technique to Control Misalignment Between Two Layers App 20160084639 - Abdulhalim; Ibrahim ; et al.	2016-03-24
Periodic patterns and techniques to control misalignment between two layers Grant 9,234,745 - Abdulhalim , et al. January 12, 2	2016-01-12
Periodic Patterns and Techniques to Control Misalignment Between Two Layers App 20150300815 - Abdulhalim; Ibrahim ; et al.	2015-10-22
Periodic patterns and technique to control misalignment between two layers Grant 9,103,662 - Abdulhalim , et al. August 11, 2	2015-08-11
Method and system for recommending Geo-tagged items Grant 8,793,248 - Friedmann , et al. July 29, 2	2014-07-29
Method And System For Recommending Geo-tagged Items App 20140046946 - Friedmann; Michael ; et al.	2014-02-13
Periodic Patterns and Technique to Control Misalignment Between Two Layers App 20140022563 - Abdulhalim; Ibrahim ; et al.	2014-01-23
Periodic patterns and technique to control misalignment between two layers Grant 8,570,515 - Abdulhalim , et al. October 29, 2	2013-10-29
Periodic patterns and technique to control misaligment between two layers Grant 8,525,994 - Abdulhalim , et al. September 3, 2	2013-09-03
Method And System For Recommending Geo-tagged Items App 20120303626 - Friedmann; Michael ; et al.	2012-11-29
Shared Image Database With Geographic Navigation App 20120129554 - FRIEDMANN; Michael	2012-05-24
Shared Image Database With Geographic Navigation App 20110207480 - FRIEDMANN; Michael	2011-08-25
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,933,016 - Mieher , et al. April 26, 2	2011-04-26
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,876,440 - Mieher , et al. January 25, 2	2011-01-25
Shared Image Database With Geographic Navigation App 20100323756 - FRIEDMANN; Michael	2010-12-23
Shared image database with geographic navigation Grant 7,797,019 - Friedmann September 14, 2	2010-09-14
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20100091284 - Mieher; Walter D. ; et al.	2010-04-15
Periodic Patterns And Technique To Control Misalignment Between Two Layers App 20100073688 - Abdulhalim; Ibrahim ; et al.	2010-03-25
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,663,753 - Mieher , et al. February 16, 2	2010-02-16
Periodic patterns and technique to control misalignment between two layers Grant 7,656,528 - Abdulhalim , et al. February 2, 2	2010-02-02
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20090284744 - Mieher; Walter D. ; et al.	2009-11-19
Periodic Patterns And Technique To Control Misaligment Between Two Layers App 20090231584 - Abdulhalim; Ibrahim ; et al.	2009-09-17
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,564,557 - Mieher , et al. July 21, 2	2009-07-21
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,433,040 - Mieher , et al. October 7, 2	2008-10-07
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,385,699 - Mieher , et al. June 10, 2	2008-06-10
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,379,183 - Mieher , et al. May 27, 2	2008-05-27
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20080094630 - Mieher; Walter D. ; et al.	2008-04-24
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20080049226 - Mieher; Walter D. ; et al.	2008-02-28
Apparatus And Methods For Detecting Overlay Errors Using Scatterometry App 20080024766 - Mieher; Walter D. ; et al.	2008-01-31
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,317,531 - Mieher , et al. January 8, 2	2008-01-08
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,301,634 - Mieher , et al. November 27, 2	2007-11-27
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,298,481 - Mieher , et al. November 20, 2	2007-11-20
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,289,213 - Mieher , et al. October 30, 2	2007-10-30
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,280,212 - Mieher , et al. October 9, 2	2007-10-09
Shared image database with geographic navigation App 20070233368 - Friedmann; Michael	2007-10-04
Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals Grant 7,277,172 - Kandel , et al. October 2, 2	2007-10-02
Apparatus and methods for detecting overlay errors using scatterometry Grant 7,242,477 - Mieher , et al. July 10, 2	2007-07-10
Periodic Patterns and Technique to Control Misalignment Between Two Layers App 20070127025 - Abdulhalim; Ibrahim ; et al.	2007-06-07
Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals App 20060274310 - Kandel; Daniel ; et al.	2006-12-07
Periodic patterns and technique to control misalignment between two layers App 20060262326 - Abdulhalim; Ibrahim ; et al.	2006-11-23
Periodic patterns and technique to control misalignment between two layers App 20060132807 - Abdulhalim; Ibrahim ; et al.	2006-06-22
Periodic patterns and technique to control misalignment between two layers App 20060065625 - Abdulhalim; Ibrahim ; et al.	2006-03-30
Periodic patterns and technique to control misalignment App 20050208685 - Abdulhalim, Ibrahim ; et al.	2005-09-22
Periodic patterns and technique to control misalignment between two layers App 20050157297 - Abdulhalim, Ibrahim ; et al.	2005-07-21
Apparatus and methods for detecting overlay errors using scatterometry App 20040257571 - Mieher, Walter D. ; et al.	2004-12-23
Apparatus and methods for detecting overlay errors using scatterometry App 20040233443 - Mieher, Walter D. ; et al.	2004-11-25
Apparatus and methods for detecting overlay errors using scatterometry App 20040233441 - Mieher, Walter D. ; et al.	2004-11-25
Apparatus and methods for detecting overlay errors using scatterometry App 20040233440 - Mieher, Walter D. ; et al.	2004-11-25
Apparatus and methods for detecting overlay errors using scatterometry App 20040233442 - Mieher, Walter D. ; et al.	2004-11-25
Apparatus and methods for detecting overlay errors using scatterometry App 20040233444 - Mieher, Walter D. ; et al.	2004-11-25
Apparatus and methods for detecting overlay errors using scatterometry App 20040233439 - Mieher, Walter D. ; et al.	2004-11-25
Periodic patterns and technique to control misalignment between two layers App 20040229471 - Abdulhalim, Ibrahim ; et al.	2004-11-18
Apparatus and method for detecting overlay errors using scatterometry App 20040169861 - Mieher, Walter D. ; et al.	2004-09-02
Periodic patterns and technique to control misalignment between two layers App 20040061857 - Abdulhalim, Ibrahim ; et al.	2004-04-01
Periodic patterns and technique to control misalignment App 20030002043 - Abdulhalim, Ibrahim ; et al.	2003-01-02

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