loadpatents
name:-0.0080070495605469
name:-0.004734992980957
name:-0.0004279613494873
Fricke; Wolfgang Patent Filings

Fricke; Wolfgang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fricke; Wolfgang.The latest application filed is for "device and method for coating in the edge area of the small sides of workpieces".

Company Profile
0.5.6
  • Fricke; Wolfgang - Hiddenhausen DE
  • Fricke; Wolfgang - Netphen DE
  • Fricke; Wolfgang - Wetzlar DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Device And Method For Coating In The Edge Area Of The Small Sides Of Workpieces
App 20120288629 - Ludewig; Daniel ;   et al.
2012-11-15
Coordinate measuring machine and method for calibrating the coordinate measuring machine
Grant 8,115,808 - Fricke , et al. February 14, 2
2012-02-14
System and method for determining positions of structures on a substrate
Grant 7,978,340 - Boesser , et al. July 12, 2
2011-07-12
Method for determining correction values for the measured values of positions of structures on a substrate
Grant 7,584,072 - Fricke , et al. September 1, 2
2009-09-01
Method for determining the focal position of at least two edges of structures on a substrate
Grant 7,551,296 - Boesser , et al. June 23, 2
2009-06-23
System and method for determining positions of structures on a substrate
App 20090033508 - Boesser; Hans-Artur ;   et al.
2009-02-05
Method for Determining Correction Values for the Measured Values of Positions of Structures on a Substrate
App 20090024351 - Fricke; Wolfgang ;   et al.
2009-01-22
Coordinate measuring machine and method for calibrating the coordinate measuring machine
App 20090002486 - Fricke; Wolfgang ;   et al.
2009-01-01
Method For Determining The Focal Position Of At Least Two Edges Of Structures On A Substrate
App 20080252903 - Boesser; Hans-Artur ;   et al.
2008-10-16
Method and measuring instrument for determining the position of an edge of a pattern element on a substrate
Grant 6,920,249 - Rinn , et al. July 19, 2
2005-07-19
Method and measuring instrument for determining the position of an edge of a pattern element on a substrate
App 20020057839 - Rinn, Klaus ;   et al.
2002-05-16

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