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name:-0.01258111000061
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FRESQUET; Gilles Patent Filings

FRESQUET; Gilles

Patent Applications and Registrations

Patent applications and USPTO patent grants for FRESQUET; Gilles.The latest application filed is for "method and device for measuring interfaces of an optical element".

Company Profile
2.11.10
  • FRESQUET; Gilles - Garrigues Sainte Eulalie FR
  • Fresquet; Gilles - Castanet Tolosan FR
  • Fresquet; Gilles - Castenet Tolosan FR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And Device For Measuring Interfaces Of An Optical Element
App 20220136822 - FRESQUET; Gilles ;   et al.
2022-05-05
Method for 2D/3D inspection of an object such as a wafer
Grant 10,240,977 - Fresquet , et al.
2019-03-26
Device and method for making dimensional measurements on multilayer objects such as wafers
Grant 10,074,172 - Fresquet , et al. September 11, 2
2018-09-11
Method and device for controllably revealing structures buried in objects such as wafers
Grant 10,043,266 - Fresquet , et al. August 7, 2
2018-08-07
Device and method for surface profilometry for the control of wafers during processing
Grant 9,958,261 - Fresquet May 1, 2
2018-05-01
Device and method for positioning a photolithography mask by a contactless optical method
Grant 9,897,927 - Fresquet , et al. February 20, 2
2018-02-20
Device And Method For Surface Profilometry For The Control Of Wafers During Processing
App 20170299376 - FRESQUET; Gilles
2017-10-19
Method For 2d/3d Inspection Of An Object Such As A Wafer
App 20170276615 - FRESQUET; Gilles ;   et al.
2017-09-28
Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer
Grant 9,739,600 - Fresquet , et al. August 22, 2
2017-08-22
Device And Method For Positioning A Photolithography Mask By A Contactless Optical Method
App 20160377995 - FRESQUET; Gilles ;   et al.
2016-12-29
Chromatic confocal device and method for 2D/3D inspection of an object such as a wafer with variable spatial resolution
Grant 9,494,529 - Fresquet , et al. November 15, 2
2016-11-15
Optical device and method for inspecting structured objects
Grant 9,151,941 - Fresquet October 6, 2
2015-10-06
Device And Method For Making Dimensional Measurements On Multilayer Objects Such As Wafers
App 20150243024 - Fresquet; Gilles ;   et al.
2015-08-27
Method And Device For Controllably Revealing Structures Buried In Objects Such As Wafers
App 20150228069 - Fresquet; Gilles ;   et al.
2015-08-13
Optical Device And Method For Inspecting Structured Objects
App 20130038863 - Fresquet; Gilles
2013-02-14
Substrate processing apparatus for processing substrates using dense phase gas and sonic waves
Grant 7,033,068 - Ching , et al. April 25, 2
2006-04-25
Substrate processing apparatus for processing substrates using dense phase gas and sonic waves
App 20050145263 - Ching, Gil ;   et al.
2005-07-07
Substrate processing apparatus for processing substrates using dense phase gas and sonic waves
Grant 6,880,560 - Ching , et al. April 19, 2
2005-04-19
Substrate processing apparatus for processing substrates using dense phase gas and sonic waves
App 20040094183 - Ching, Gil ;   et al.
2004-05-20

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