FREITAG; Bert Henning
Patent Applications and Registrations
Patent applications and USPTO patent grants for FREITAG; Bert Henning.The latest application filed is for "dual speed acquisition for drift corrected, fast, low dose, adaptive compositional charged particle imaging".
- FREITAG; Bert Henning - Eindhoven NL
| Patent | Date |
|---|---|
| Dual Speed Acquisition For Drift Corrected, Fast, Low Dose, Adaptive Compositional Charged Particle Imaging App 20220310353 - POTOCEK; Pavel ; et al. | 2022-09-29 |
| System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopy Grant 11,211,223 - December 28, 2 | 2021-12-28 |
| System and method for RF pulsed electron beam based STEM Grant 11,127,562 - Kieft , et al. September 21, 2 | 2021-09-21 |
| EELS detection technique in an electron microscope Grant 10,832,901 - Freitag , et al. November 10, 2 | 2020-11-10 |
| Eels Detection Technique In An Electron Microscope App 20190341243 - Freitag; Bert Henning ; et al. | 2019-11-07 |
| Transmission charged particle microscope with imaging beam rotation Grant 10,224,174 - Freitag , et al. | 2019-03-05 |
| Mounting structures for multi-detector electron microscopes Grant 8,993,963 - von Harrach , et al. March 31, 2 | 2015-03-31 |
| Mounting structures for multi-detector electron microscopes App 20140319347 - von Harrach; Hanno Sebastian ; et al. | 2014-10-30 |
| Simultaneous electron detection Grant 8,859,966 - Tiemeijer , et al. October 14, 2 | 2014-10-14 |
| X-ray Detector for Electron Microscope App 20140077080 - Von Harrach; Hanno Sebastian ; et al. | 2014-03-20 |
| X-ray detector for electron microscope Grant 8,592,764 - von Harrach , et al. November 26, 2 | 2013-11-26 |
| X-ray Detector For Electron Microscope App 20130240731 - von Harrach; Hanno Sebastian ; et al. | 2013-09-19 |
| Contrast for scanning confocal electron microscope Grant 8,405,027 - Lazar , et al. March 26, 2 | 2013-03-26 |
| Method for inspecting a sample Grant 8,389,936 - Freitag , et al. March 5, 2 | 2013-03-05 |
| Method of machining a work piece with a focused particle beam Grant 8,168,948 - Botman , et al. May 1, 2 | 2012-05-01 |
| Contrast for Scanning Confocal Electron Microscope App 20120012747 - Lazar; Sorin ; et al. | 2012-01-19 |
| Simultaneous Electron Detection App 20110278451 - Tiemeijer; Peter Christiaan ; et al. | 2011-11-17 |
| Method for Inspecting a Sample App 20110006208 - Freitag; Bert Henning ; et al. | 2011-01-13 |
| Method of Machining a Work Piece with a Focused Particle Beam App 20100032567 - Maclou Botman; Aurelien Philippe Jean ; et al. | 2010-02-11 |
| Method for determining lens errors in a particle-optical device Grant 7,518,121 - Maas , et al. April 14, 2 | 2009-04-14 |
| Method for determining lens errors in a particle-optical device App 20070045558 - Maas; Diederik Jan ; et al. | 2007-03-01 |
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