loadpatents
name:-0.0010960102081299
name:-0.011902809143066
name:-0.00044703483581543
Fredrickson; Toby Alan Patent Filings

Fredrickson; Toby Alan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fredrickson; Toby Alan.The latest application filed is for "method for testing damaged integrated circuits".

Company Profile
0.8.0
  • Fredrickson; Toby Alan - San Jose CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for testing damaged integrated circuits
Grant 6,681,352 - Fredrickson January 20, 2
2004-01-20
System and apparatus for low-temperature semiconductor device testing
Grant 6,420,885 - Fredrickson July 16, 2
2002-07-16
Apparatus and method for testing chip scale package integrated circuits
Grant 6,292,003 - Fredrickson , et al. September 18, 2
2001-09-18
Method for preventing condensation on handler board during semiconductor device testing
Grant 6,292,006 - Fredrickson September 18, 2
2001-09-18
Semiconductor device tester-to-handler Interface board with large test area
Grant 6,118,286 - Fredrickson September 12, 2
2000-09-12
Interface structure for an integrated circuit device tester
Grant 5,945,837 - Fredrickson August 31, 1
1999-08-31
System and method for testing integrated circuits in dry atmosphere
Grant 5,907,245 - Fredrickson May 25, 1
1999-05-25
System for expanding space provided by test computer to test multiple integrated circuits simultaneously
Grant 5,705,932 - Fredrickson January 6, 1
1998-01-06

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