Frankowsky; Gerd

Patent Applications and Registrations

Patent applications and USPTO patent grants for Frankowsky; Gerd.The latest application filed is for "test apparatus for semiconductor modules".

Company Profile

0.39.35

Frankowsky; Gerd - Hoehenkirchen-Siegertsbrunn DE
Frankowsky; Gerd - Siegertsbrunn DE
Frankowsky; Gerd - Hohenkirchen DE
Frankowsky; Gerd - Hoehenkirchen DE
Frankowsky; Gerd - Hohenkirchen-Siegertsbrunn DE
Frankowsky; Gerd - Hohenkirchen-Sipyertsbrunn DE
Frankowsky; Gerd - Taufkirchen DE
Frankowsky; Gerd - Wappingers Falls NY
Frankowsky; Gerd - Munich DE
Frankowsky; Gerd - Hohenkirchen-Sigertsbrunn DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test Apparatus For Semiconductor Modules App 20090039910 - Frankowsky; Gerd ; et al.	2009-02-12
Apparatus and method for monitoring a state, in particular of a fuse Grant 7,483,326 - Frankowsky January 27, 2	2009-01-27
Method and test device for determining a repair solution for a memory module Grant 7,437,627 - Frankowsky October 14, 2	2008-10-14
Integrated circuit, test system and method for reading out an error datum from the integrated circuit Grant 7,434,125 - Frankowsky October 7, 2	2008-10-07
Test system for testing integrated circuits and a method for configuring a test system Grant 7,427,870 - Frankowsky September 23, 2	2008-09-23
Method and device for verifying output signals of an integrated circuit Grant 7,409,308 - Frankowsky , et al. August 5, 2	2008-08-05
Method And Device For Verifying Output Signals Of An Integrated Circuit App 20080059102 - Frankowsky; Gerd ; et al.	2008-03-06
Semiconductor circuit device and a system for testing a semiconductor apparatus Grant 7,331,005 - Arnold , et al. February 12, 2	2008-02-12
Integrated module having a plurality of separate substrates Grant 7,228,473 - Frankowsky June 5, 2	2007-06-05
Process for producing a component module Grant 7,211,451 - Meyer , et al. May 1, 2	2007-05-01
Test system for testing integrated chips and an adapter element for a test system Grant 7,208,968 - Weber , et al. April 24, 2	2007-04-24
Level-shifting circuitry having "high" output impedance during disable mode Grant 7,173,473 - Terletzki , et al. February 6, 2	2007-02-06
Integrated circuit, test system and method for reading out an error datum from the integrated circuit App 20060262614 - Frankowsky; Gerd	2006-11-23
Test system for testing integrated circuits and a method for configuring a test system App 20060198211 - Frankowsky; Gerd	2006-09-07
Semiconductor circuit module and method for fabricating semiconductor circuit modules Grant 7,074,696 - Frankowsky , et al. July 11, 2	2006-07-11
Calibration device for the calibration of a tester channel of a tester device and a test system Grant 7,061,260 - Frankowsky , et al. June 13, 2	2006-06-13
Multiple chip semiconductor arrangement having electrical components in separating regions Grant 7,060,529 - Reithinger , et al. June 13, 2	2006-06-13
Integrated test circuit in an integrated circuit Grant 7,034,559 - Frankowsky , et al. April 25, 2	2006-04-25
Semiconductor circuit device and a system for testing a semiconductor apparatus App 20060026475 - Arnold; Ralf ; et al.	2006-02-02
Method for activating fuse units in electronic circuit device Grant 6,961,917 - Frankowsky November 1, 2	2005-11-01
Recording test information to identify memory cell errors Grant 6,961,880 - Frankowsky November 1, 2	2005-11-01
Integrated module having a plurality of separate substrates App 20050235180 - Frankowsky, Gerd	2005-10-20
Memory device and method of storing fail addresses of a memory cell Grant 6,937,531 - Frankowsky August 30, 2	2005-08-30
Self trimming voltage generator Grant 6,909,642 - Lehmann , et al. June 21, 2	2005-06-21
Multi-chip module and method for testing App 20050086564 - Frankowsky, Gerd ; et al.	2005-04-21
Calibration device for the calibration of a tester channel of a tester device and a test system App 20050046436 - Frankowsky, Gerd ; et al.	2005-03-03
Level-shifting circuitry having "high" output impedance during disable mode Grant 6,853,233 - Terletzki , et al. February 8, 2	2005-02-08
Memory device and method of storing fail addresses of a memory cell App 20050018497 - Frankowsky, Gerd	2005-01-27
Test system for testing integrated chips and an adapter element for a test system App 20050017748 - Weber, Frank ; et al.	2005-01-27
Method for connection of circuit units Grant 6,845,554 - Frankowsky , et al. January 25, 2	2005-01-25
Multiple chip semiconductor arrangement having electrical components in separating regions App 20050001298 - Reithinger, Manfred ; et al.	2005-01-06
Integrated circuit having a test circuit App 20040222812 - Frankowsky, Gerd ; et al.	2004-11-11
Method and test device for determining a repair solution for a memory module App 20040223387 - Frankowsky, Gerd	2004-11-11
Integrated test circuit in an integrated circuit App 20040222810 - Frankowsky, Gerd ; et al.	2004-11-11
Multiple chip semiconductor arrangement having electrical components in separating regions Grant 6,815,803 - Reithinger , et al. November 9, 2	2004-11-09
Circuit technique for column redundancy fuse latches Grant 6,809,972 - Lehmann , et al. October 26, 2	2004-10-26
Circuit Technique For Column Redundancy Fuse Latches App 20040179412 - Lehmann, Gunther ; et al.	2004-09-16
Self trimming voltage generator App 20040179417 - Lehmann, Gunther ; et al.	2004-09-16
Integrated semiconductor circuit having contact points and configuration having at least two such circuits Grant 6,734,474 - Frankowsky May 11, 2	2004-05-11
Semiconductor package and method Grant 6,730,989 - Reithinger , et al. May 4, 2	2004-05-04
Semiconductor component Grant 6,727,586 - Frankowsky , et al. April 27, 2	2004-04-27
Method for assessing the quality of a memory unit Grant 6,717,870 - Frankowsky April 6, 2	2004-04-06
Method for producing an electronic component having a plurality of chips that are stacked one above the other and contact-connected to one another Grant 6,714,418 - Frankowsky , et al. March 30, 2	2004-03-30
Fuse programmable I/O organization Grant 6,707,746 - Frankowsky , et al. March 16, 2	2004-03-16
Method of attaching semiconductor devices on a switching device and such an attached device Grant 6,696,319 - Frankowsky , et al. February 24, 2	2004-02-24
Method for checking a conductive connection between contact points Grant 6,697,291 - Frankowsky February 24, 2	2004-02-24
Programmable test socket Grant 6,677,770 - Frankowsky January 13, 2	2004-01-13
Semiconductor wafer testing system and method Grant 6,657,453 - Frankowsky December 2, 2	2003-12-02
On chip programmable data pattern generator for semiconductor memories Grant 6,651,203 - Frankowsky November 18, 2	2003-11-18
Semiconductor chip configuration with a layer sequence with functional elements contacted by contact pads Grant 6,649,999 - Frankowsky November 18, 2	2003-11-18
Semiconductor Wafer Testing System And Method App 20030173987 - Frankowsky, Gerd	2003-09-18
Apparatus and method for monitoring a state, in particular of a fuse App 20030174040 - Frankowsky, Gerd	2003-09-18
Twisted bit-line compensation Grant 6,608,783 - Frankowsky , et al. August 19, 2	2003-08-19
Dynamic Memory Refresh Circuitry App 20030147295 - Frankowsky, Gerd ; et al.	2003-08-07
Dynamic memory refresh circuitry Grant 6,603,694 - Frankowsky , et al. August 5, 2	2003-08-05
Method for activating fuse units in electronic circuit device App 20030145303 - Frankowsky, Gerd	2003-07-31
Method to descramble the data mapping in memory circuits Grant 6,601,205 - Lehmann , et al. July 29, 2	2003-07-29
Twisted Bit-line Compensation App 20030133320 - Frankowsky, Gerd ; et al.	2003-07-17
Method for connection of circuit units App 20030110628 - Frankowsky, Gerd ; et al.	2003-06-19
Method for producing an electronic component having a plurality of chips that are stacked one above the other and contact-connected to one another App 20030112610 - Frankowsky, Gerd ; et al.	2003-06-19
Solder-free PCB assembly Grant 6,580,613 - Frankowsky June 17, 2	2003-06-17
Process for producing a component module App 20030109072 - Meyer, Thorsten ; et al.	2003-06-12
Semiconductor component App 20030094701 - Frankowsky, Gerd ; et al.	2003-05-22
Method of attaching semiconductor devices on a switching device and such an attached device App 20030085474 - Frankowsky, Gerd ; et al.	2003-05-08
Fuse programmable I/O organization App 20030026159 - Frankowsky, Gerd ; et al.	2003-02-06
Recording test information to identify memory cell errors App 20030023902 - Frankowsky, Gerd	2003-01-30
Programmable test socket App 20030016038 - Frankowsky, Gerd	2003-01-23
Integrated semiconductor circuit having contact points and configuration having at least two such circuits App 20030015734 - Frankowsky, Gerd	2003-01-23
Solder-free PCB assembly App 20030016503 - Frankowsky, Gerd	2003-01-23
Method for checking a conductive connection between contact points App 20030002369 - Frankowsky, Gerd	2003-01-02
Method for assessing the quality of a memory unit App 20030002362 - Frankowsky, Gerd	2003-01-02
Semiconductor chip configuration and fabrication method App 20030003744 - Frankowsky, Gerd	2003-01-02
Dynamic DRAM refresh rate adjustment based on cell leakage monitoring Grant 6,483,764 - Chen Hsu , et al. November 19, 2	2002-11-19
Dynamic dram refresh rate adjustment based on cell leakage monitoring App 20020136075 - Chen Hsu, Louis Lu ; et al.	2002-09-26