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name:-0.0069921016693115
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Franken; Erik Michiel Patent Filings

Franken; Erik Michiel

Patent Applications and Registrations

Patent applications and USPTO patent grants for Franken; Erik Michiel.The latest application filed is for "systems and methods for quantum computing based sample analysis".

Company Profile
7.6.7
  • Franken; Erik Michiel - Eindhoven NL
  • Franken; Erik Michiel - Nuenen NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of imaging a sample using an electron microscope
Grant 10,937,625 - Franken , et al. March 2, 2
2021-03-02
Systems And Methods For Quantum Computing Based Sample Analysis
App 20210049493 - Vivoli; Valentina Caprara ;   et al.
2021-02-18
Innovative imaging technique in transmission charged particle microscopy
Grant 10,825,647 - Janssen , et al. November 3, 2
2020-11-03
Method Of Imaging A Sample Using An Electron Microscope
App 20200168433 - Franken; Erik Michiel ;   et al.
2020-05-28
Intelligent pre-scan in scanning transmission charged particle microscopy
Grant 10,665,419 - Franken , et al.
2020-05-26
Intelligent Pre-scan In Scanning Transmission Charged Particle Microscopy
App 20190295814 - FRANKEN; Erik Michiel ;   et al.
2019-09-26
Method for detecting particulate radiation
Grant 10,389,955 - Janssen , et al. A
2019-08-20
Innovative Imaging Technique In Transmission Charged Particle Microscopy
App 20190228949 - JANSSEN; Bart Jozef ;   et al.
2019-07-25
Method For Detecting Particulate Radiation
App 20190075258 - Janssen; Bart Josef ;   et al.
2019-03-07
Method for detecting particulate radiation
Grant 10,122,946 - Janssen , et al. November 6, 2
2018-11-06
Method For Detecting Particulate Radiation
App 20170134674 - Janssen; Bart Jozef ;   et al.
2017-05-11
Method of performing tomographic imaging of a sample in a charged-particle microscope
Grant 8,912,491 - Schoenmakers , et al. December 16, 2
2014-12-16
Method Of Performing Tomographic Imaging Of A Sample In A Charged-particle Microscope
App 20140145077 - Schoenmakers; Remco ;   et al.
2014-05-29

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