Fouquet; Christophe David
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fouquet; Christophe David.The latest application filed is for "metrology method, target and substrate".
- Fouquet; Christophe David - Retie BE
| Patent | Date |
|---|---|
| Metrology method, target and substrate Grant 11,428,521 - Bhattacharyya , et al. August 30, 2 | 2022-08-30 |
| Metrology Method, Target And Substrate App 20220057192 - BHATTACHARYYA; Kaustuve ; et al. | 2022-02-24 |
| Metrology method, target and substrate Grant 11,204,239 - Bhattacharyya , et al. December 21, 2 | 2021-12-21 |
| Computational Wafer Inspection App 20210357570 - FOUQUET; Christophe David ; et al. | 2021-11-18 |
| Computational wafer inspection Grant 11,080,459 - Fouquet , et al. August 3, 2 | 2021-08-03 |
| Metrology Method, Target And Substrate App 20200348125 - BHATTACHARYYA; Kaustuve ; et al. | 2020-11-05 |
| Metrology method, target and substrate Grant 10,718,604 - Bhattacharyya , et al. | 2020-07-21 |
| Computational Wafer Inspection App 20200218849 - Fouquet; Christophe David ; et al. | 2020-07-09 |
| Computational wafer inspection Grant 10,579,772 - Fouquet , et al. | 2020-03-03 |
| Metrology Method, Target And Substrate App 20190346256 - BHATTACHARYYA; Kaustuve ; et al. | 2019-11-14 |
| Metrology method, target and substrate Grant 10,386,176 - Bhattacharyya , et al. A | 2019-08-20 |
| Computational Wafer Inspection App 20180365369 - FOUQUET; Christophe David ; et al. | 2018-12-20 |
| Computational wafer inspection Grant 9,990,462 - Fouquet , et al. June 5, 2 | 2018-06-05 |
| Computational Wafer Inspection App 20170046473 - FOUQUET; Christophe David ; et al. | 2017-02-16 |
| Computational wafer inspection Grant 9,507,907 - Fouquet , et al. November 29, 2 | 2016-11-29 |
| Metrology Method, Target And Substrate App 20160061589 - BHATTACHARYYA; Kaustuve ; et al. | 2016-03-03 |
| Computational Wafer Inspection App 20150356233 - FOUQUET; Christophe David ; et al. | 2015-12-10 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 