Fouquet; Christophe

Patent Applications and Registrations

Patent applications and USPTO patent grants for Fouquet; Christophe.The latest application filed is for "systems and methods for detecting design and process defects on a wafer, reviewing defects on a wafer, selecting one or more features within a design for use as process monitoring features, or some combination thereof".

Company Profile

0.7.6

Fouquet; Christophe - Sunnyvale CA US
Fouquet; Christophe - Alpharetta GA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for detecting design and process defects on a wafer using process monitoring features Grant 9,710,903 - Fouquet , et al. July 18, 2	2017-07-18
Virtual metering with partitioned metrology Grant 9,082,291 - Barrett , et al. July 14, 2	2015-07-14
Use of design information and defect image information in defect classification Grant 8,175,373 - Abbott , et al. May 8, 2	2012-05-08
Systems And Methods For Detecting Design And Process Defects On A Wafer, Reviewing Defects On A Wafer, Selecting One Or More Features Within A Design For Use As Process Monitoring Features, Or Some Combination Thereof App 20110276935 - Fouquet; Christophe ; et al.	2011-11-10
Determining locations on a wafer to be reviewed during defect review Grant 7,904,845 - Fouquet , et al. March 8, 2	2011-03-08
Use Of Design Information And Defect Image Information In Defect Classification App 20100208979 - Abbott; Gordon ; et al.	2010-08-19
Methods, defect review tools, and systems for locating a defect in a defect review process Grant 7,747,062 - Chen , et al. June 29, 2	2010-06-29
Methods, Designs, Defect Review Tools, And Systems For Determining Locations On A Wafer To Be Reviewed During Defect Review App 20080163140 - Fouquet; Christophe ; et al.	2008-07-03
Methods, defect review tools, and systems for locating a defect in a defect review process App 20080032429 - Chen; Da ; et al.	2008-02-07
Facility modelization for facility benchmarking App 20070219841 - Fouquet; Christophe	2007-09-20
System and method for creating dynamic facility models with data normalization as attributes change over time Grant 7,219,069 - Fouquet May 15, 2	2007-05-15
Facility modelization for facility benchmarking App 20020165750 - Fouquet, Christophe	2002-11-07

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