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name:-0.0078408718109131
name:-0.0093619823455811
name:-0.00047612190246582
Forlenza; Donato Orazio Patent Filings

Forlenza; Donato Orazio

Patent Applications and Registrations

Patent applications and USPTO patent grants for Forlenza; Donato Orazio.The latest application filed is for "verification of array built-in self-test (abist) design-for-test/design-for-diagnostics (dft/dfd)".

Company Profile
0.7.6
  • Forlenza; Donato Orazio - Hopewell Junction NY
  • Forlenza; Donato Orazio - Dutchess County NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Implementing diagnosis of transitional scan chain defects using logic built in self test LBIST test patterns
Grant 8,086,924 - Forlenza , et al. December 27, 2
2011-12-27
Implementing isolation of VLSI scan chain using ABIST test patterns
Grant 8,065,575 - Forlenza , et al. November 22, 2
2011-11-22
Verification of array built-in self-test (ABIST) design-for-test/design-for-diagnostics (DFT/DFD)
Grant 7,921,346 - Forlenza , et al. April 5, 2
2011-04-05
Verification Of Array Built-in Self-test (abist) Design-for-test/design-for-diagnostics (dft/dfd)
App 20100115337 - Forlenza; Donato Orazio ;   et al.
2010-05-06
Implementing Diagnosis of Transitional Scan Chain Defects Using LBIST Test Patterns
App 20100095177 - Forlenza; Donato Orazio ;   et al.
2010-04-15
Implementing Isolation of VLSI Scan Chain Using ABIST Test Patterns
App 20100095169 - Forlenza; Donato Orazio ;   et al.
2010-04-15
implementing deterministic based broken scan chain diagnostics
Grant 7,475,308 - Anderson , et al. January 6, 2
2009-01-06
Apparatus, And Computer Program Product For Implementing Deterministic Based Broken Scan Chain Diagnostics
App 20080189583 - Anderson; Adrian C. ;   et al.
2008-08-07
Method for implementing deterministic based broken scan chain diagnostics
Grant 7,395,469 - Anderson , et al. July 1, 2
2008-07-01
ABIST-assisted detection of scan chain defects
Grant 7,225,374 - Burdine , et al. May 29, 2
2007-05-29
Method, apparatus, and computer program product for implementing deterministic based broken scan chain diagnostics
App 20050229057 - Anderson, Adrian C. ;   et al.
2005-10-13
ABIST-assisted detection of scan chain defects
App 20050138514 - Burdine, Todd Michael ;   et al.
2005-06-23
Fast flush load of LSSD SRL chains
Grant 5,640,402 - Motika , et al. June 17, 1
1997-06-17

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