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Patent applications and USPTO patent grants for Foong; Yee Mei.The latest application filed is for "system and methods for opc model accuracy management and disposition".
Patent | Date |
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System and methods for OPC model accuracy management and disposition Grant 9,286,435 - Cheng , et al. March 15, 2 | 2016-03-15 |
System And Methods For Opc Model Accuracy Management And Disposition App 20150269306 - CHENG; Yong Wah Jacky ;   et al. | 2015-09-24 |
System And Methods For Opc Model Accuracy Management And Disposition App 20150186577 - CHENG; Yong Wah Jacky ;   et al. | 2015-07-02 |
System and methods for OPC model accuracy management and disposition Grant 9,053,269 - Cheng , et al. June 9, 2 | 2015-06-09 |
Etch failure prediction based on wafer resist top loss Grant 8,898,597 - Yang , et al. November 25, 2 | 2014-11-25 |
Etch Failure Prediction Based On Wafer Resist Top Loss App 20140282286 - YANG; Qing ;   et al. | 2014-09-18 |
Integrated circuit with protective moat Grant 7,224,060 - Zhang , et al. May 29, 2 | 2007-05-29 |
Integrated circuit with protective moat App 20050167824 - Zhang, Fan ;   et al. | 2005-08-04 |
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