FONSECA; Carlos
Patent Applications and Registrations
Patent applications and USPTO patent grants for FONSECA; Carlos.The latest application filed is for "virtual metrology for wafer result prediction".
- FONSECA; Carlos - Austin TX
- Fonseca, Carlos - Staten Island NY
| Patent | Date |
|---|---|
| Virtual Metrology For Wafer Result Prediction App 20220092242 - SHINAGAWA; Jun ; et al. | 2022-03-24 |
| Photo-sensitized chemically amplified resist (PS-CAR) model calibration Grant 10,048,594 - Carcasi , et al. August 14, 2 | 2018-08-14 |
| Photo-sensitized Chemically Amplified Resist (PS-CAR) model calibration App 20170242344 - Carcasi; Michael ; et al. | 2017-08-24 |
| Pitch-based subresolution assist feature design App 20040172610 - Liebmann, Lars W. ; et al. | 2004-09-02 |
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