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Patent applications and USPTO patent grants for Foes; Scott.The latest application filed is for "transient defect detection algorithm".
Patent | Date |
---|---|
Transient defect detection algorithm Grant 7,591,583 - Foes , et al. September 22, 2 | 2009-09-22 |
Diffraction method for measuring thickness of a workpart Grant 7,400,417 - Foes July 15, 2 | 2008-07-15 |
Diffraction method for measuring thickness of a workpart App 20060262327 - Foes; Scott | 2006-11-23 |
Transient defect detection algorithm App 20060262971 - Foes; Scott ;   et al. | 2006-11-23 |
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