FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD.

Patent Applications and Registrations

Patent applications and USPTO patent grants for FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD..The latest application filed is for "microscope".

Company Profile

20.14.14

FOCUS-EBEAM TECHNOLOGY (BEIJING) CO., LTD. - Beijing CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Microscope App 20220108870 - LI; Shuai ; et al.	2022-04-07
Scanning Electron Microscope App 20210391142 - LIU; Sha ; et al.	2021-12-16
Scanning electron microscope with composite detection system and specimen detection method Grant 11,145,487 - Li October 12, 2	2021-10-12
Imaging System And Method For Specimen Detection App 20210231589 - HE; Wei ; et al.	2021-07-29
Scanning electron microscope objective lens system and method for specimen observation Grant 11,075,056 - Li , et al. July 27, 2	2021-07-27
Scanning Electron Microscope Objective Lens System And Method For Specimen Observation App 20210110994 - Li; Shuai ; et al.	2021-04-15
Scanning Electron Microscope With Composite Detection System And Specimen Detection Method App 20210066031 - LI; Shuai	2021-03-04
Magnetic lens and exciting current control method Grant 10,923,312 - He , et al. February 16, 2	2021-02-16
Vacuum condition processing apparatus, system and method for specimen observation Grant 10,903,039 - He , et al. January 26, 2	2021-01-26
Charged particle beam system, opto-electro simultaneous detection system and method Grant 10,879,036 - He , et al. December 29, 2	2020-12-29
Low voltage scanning electron microscope and method for specimen observation Grant 10,777,382 - Li , et al. Sept	2020-09-15
Low Voltage Scanning Electron Microscope And Method For Specimen Observation App 20200234914 - Li; Shuai ; et al.	2020-07-23
Vacuum condition controlling apparatus, system and method for specimen observation Grant 10,699,874 - He , et al.	2020-06-30
Vacuum Condition Controlling Apparatus, System And Method For Specimen Observation App 20200035448 - He; Wei ; et al.	2020-01-30
Vacuum Condition Processing Apparatus, System And Method For Specimen Observation App 20200035443 - He; Wei ; et al.	2020-01-30
Magnetic Lens And Exciting Current Control Method App 20190295808 - He; Wei ; et al.	2019-09-26
Charged Particle Beam System, Opto-electro Simultaneous Detection System And Method App 20190287760 - He; Wei ; et al.	2019-09-19

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