Florek; Stefan

Patent Applications and Registrations

Patent applications and USPTO patent grants for Florek; Stefan.The latest application filed is for "spectrometer arrangement".

Company Profile

0.12.8

Florek; Stefan - Berlin N/A DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Spectrometer arrangement Grant 8,873,048 - Florek , et al. October 28, 2	2014-10-28
Echelle spectrometer arrangement using internal predispersion Grant 8,681,329 - Becker-Ro.beta. , et al. March 25, 2	2014-03-25
Spectrometer Arrangement App 20120262713 - Florek; Stefan ; et al.	2012-10-18
Spectrometer assembly Grant 8,102,527 - Becker-Ross , et al. January 24, 2	2012-01-24
Echelle Spectrometer Arrangement Using Internal Predispersion App 20110285993 - Becker-Ross; Helmut ; et al.	2011-11-24
Method for determining background and correction of broadband background Grant 7,876,435 - Becker-Ross , et al. January 25, 2	2011-01-25
Echelle spectometer with improved use of the detector by means of two spectrometer arrangements Grant 7,804,593 - Becker-Ro.beta. , et al. September 28, 2	2010-09-28
Spectrometer Assembly App 20100171953 - Becker-Ross; Helmut ; et al.	2010-07-08
Method for determining background and correction of broadband background App 20080106735 - Becker-Ross; Helmut ; et al.	2008-05-08
Echelle Spectometer with Improved Use of the Detector by Means of Two Spectrometer Arrangements App 20080094626 - Becker-Ross; Helmut ; et al.	2008-04-24
Method for the analysis of echelle spectra Grant 7,319,519 - Florek , et al. January 15, 2	2008-01-15
Assembly and method for wavelength calibration in an echelle spectrometer Grant 7,215,422 - Florek , et al. May 8, 2	2007-05-08
Assembly and method for wavelength calibration in an echelle spectrometer App 20050157293 - Florek, Stefan ; et al.	2005-07-21
Method for the analysis of echelle spectra App 20040114139 - Florek, Stefan ; et al.	2004-06-17
High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile Grant 6,717,670 - Becker-Ross , et al. April 6, 2	2004-04-06
High-resolution littrow spectrometer and method for the quasi-simultaneous determination of a wavelength and a line profile App 20020180969 - Becker-Ross, Helmut ; et al.	2002-12-05
Adjustable echelle spectrometer arrangement and method for its adjustment Grant 4,856,898 - Becker-Ross , et al. August 15, 1	1989-08-15
Optical system for spectral analysis devices Grant 4,690,559 - Florek , et al. September 1, 1	1987-09-01

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