Flock; Klaus

Patent Applications and Registrations

Patent applications and USPTO patent grants for Flock; Klaus.The latest application filed is for "optical display device and method of operating an optical display device".

Company Profile

0.15.10

Flock; Klaus - Regensburg DE
Flock; Klaus - Sunnyvale CA
Flock; Klaus - Mountainview CA US
Flock; Klaus - Mountain View CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical display device and method of operating an optical display device Grant 11,425,348 - Flock , et al. August 23, 2	2022-08-23
Optoelectronic semiconductor device and flashlight Grant 11,280,454 - Flock , et al. March 22, 2	2022-03-22
Optical Display Device And Method Of Operating An Optical Display Device App 20210352249 - FLOCK; Klaus ; et al.	2021-11-11
Optoelectronic Semiconductor Device And Flashlight App 20210285606 - FLOCK; Klaus ; et al.	2021-09-16
Broadband and wide field angle compensator Grant 9,857,292 - Rotter , et al. January 2, 2	2018-01-02
Broadband And Wide Field Angle Compensator App 20170052112 - Rotter; Lawrence ; et al.	2017-02-23
Broadband and wide field angle compensator Grant 9,519,093 - Rotter , et al. December 13, 2	2016-12-13
Pulsed laser induced plasma light source Grant 9,506,871 - Flock November 29, 2	2016-11-29
Selectably configurable multiple mode spectroscopic ellipsometry Grant 9,404,872 - Wang , et al. August 2, 2	2016-08-02
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,310,290 - Wang , et al. April 12, 2	2016-04-12
Two dimensional optical detector with multiple shift registers Grant 9,217,717 - Flock December 22, 2	2015-12-22
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20150285735 - Wang; David Y. ; et al.	2015-10-08
Light source tracking in optical metrology system Grant 9,146,156 - Zhuang , et al. September 29, 2	2015-09-29
Multiple angles of incidence semiconductor metrology systems and methods Grant 9,116,103 - Wang , et al. August 25, 2	2015-08-25
Broadband And Wide Field Angle Compensator App 20150055123 - Rotter; Lawrence ; et al.	2015-02-26
Multiple Angles Of Incidence Semiconductor Metrology Systems And Methods App 20140375981 - Wang; David Y. ; et al.	2014-12-25
Selective diffraction with in-series gratings Grant 8,873,050 - Flock October 28, 2	2014-10-28
Two Dimensional Optical Detector With Multiple Shift Registers App 20140166862 - Flock; Klaus	2014-06-19
Calibration Of An Optical Metrology System For Critical Dimension Application Matching App 20130245985 - Flock; Klaus ; et al.	2013-09-19
Light Source Tracking In Optical Metrology System App 20130033704 - Zhuang; Guorong V. ; et al.	2013-02-07
Normal incidence ellipsometer with complementary waveplate rotating compensators Grant 7,889,340 - Flock , et al. February 15, 2	2011-02-15
Complementary waveplate rotating compensator ellipsometer Grant 7,889,339 - Flock , et al. February 15, 2	2011-02-15

Company Registrations

SEC

0001612298

FLOCK KLAUS

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