Fleig; Jon
Patent Applications and Registrations
Patent applications and USPTO patent grants for Fleig; Jon.The latest application filed is for "integrated wavefront sensor and profilometer".
- Fleig; Jon - Rochester NY
| Patent | Date |
|---|---|
| Integrated wavefront sensor and profilometer Grant 9,097,612 - Kulawiec , et al. August 4, 2 | 2015-08-04 |
| Integrated Wavefront Sensor And Profilometer App 20140152999 - KULAWIEC; Andrew ; et al. | 2014-06-05 |
| Method for calibrating the geometry of a multi-axis metrology system Grant 7,173,691 - Murphy , et al. February 6, 2 | 2007-02-06 |
| Method for calibrating the geometry of a multi-axis metrology system App 20050134851 - Murphy, Paul ; et al. | 2005-06-23 |
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